Schlumberger Technologies, Inc.

Nptest, Inc.

John W Joy

Gary A Wells

Chris A Shmatovich

Myngoc T Nguyen

Gary W Griffin

Carl R Gore

A test system includes (a) a tester mechanism ( and ) having tester contacts ( ) for carrying test signals, (b) an interface module ( ), and (c) a device-side board ( ) having device-side contacts ( ) for connection to external leads of an electronic device ( ) under test. The interface module contains a tester-side body ( ) having tester-side openings ( ) for being positioned opposite the tester contacts, a device-side body ( ) having device-side openings ( ) for being positioned opposite the device-side contacts, and interface conductors ( ) extending through the tester-side and device-side openings for connecting the tester contacts to the device-side contacts. The tester body is configured, typically as at least five wedge-shaped portions ( ), in such a manner as to enable the electronic device under test to have an increased number of external leads.

Test system and associated interface module

A module ( ) for a test system interfaces between (a) a tester mechanism ( and ) having tester contacts ( ) for carrying test signals and (b) a device-side board ( ) having device-side contacts ( ) for connection to external leads of an electronic device ( ) under test. The interface module contains a tester side body ( ) having tester side openings ( ) for being positioned opposite the tester-side contacts, a device-side body ( ) having device-side openings ( ) for being positioned opposite the device-side openings, and interface conductors ( ) extending through the tester-side and device-side openings for connecting the tester contacts to the device-side contacts. The tester body is configured, typically as at least five wedge-shaped portions ( ), in such a manner as to enable the electronic device under test to have an increased number of external leads.

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Paradise, CA, United States of America

John W Joy