Cascade Microtech, Inc.

Optimize Technologies, Inc.

Berlex Laboratories, Inc.

Sharp Laboratories of America, Inc

John T Martin

Mike Andrews

K Reed Gleason

Leonard A Hayden

Tim Lesher

John L Dunklee

Eric W Strid

Amr M E Safwat

Andrew I Chitty

Derrick S Levanen

Raju Mohan

Michael M Morrissey

Brad Owen Buckman

Peter McCann

Douglas W Ford

Peter Navratil

Cali Sartor

Saleh Mohammed Mirani

Thane Allison

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Probe for testing a device under test

The present invention relates to a method of assembling a probe for testing of integrated circuits or other microelectronic devices.

Method of assembling a wafer probe

The present invention relates to a probe tip assembly for testing of integrated circuits or other microelectronic devices. The probe tip assembly may include a plurality of independently flexible contact fingers extending from a support, each contact finger spaced apart from the other contact fingers, and each contact finger terminating in free space at an end distal from the support. A probe may be constructed by attaching the free ends of the contact fingers to electrical contacts on a circuit board and then removing the support from the contact fingers.

Wafer probe

A fluid dispensing apparatus and system for facilitating dispensing small volume, fluid samples to microfluidic devices.

Fluid dispensing system

Shielded probe for testing a device under test

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.

The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.

A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Shielded probe with low contact resistance for testing a device under test

A probe assembly including a probe, a waveguide to transmission path transition, and a bias tee detachably connected to the probe.

Waveguide adapter for probe assembly having a detachable bias tee

A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second surface a ground path that shields both the signal path and the probe tip.

Growing community of inventors

Portland, OR, United States of America

John T Martin