University of Nevada

Board of Regents of the Nevada System of Higher Education

John Sutko

Nelson George Publicover

Josh Larkin

Joshua David Larkin

Localization methods and methods for localizing a light source using multivariate statistical analysis. In particular, a multi-variate distribution, such as a multi-variate normal distribution, may be used to localize photons originating from a light source and, in particular, may be used to analyze photon position maps acquired by Photon Event Distribution Sampling (PEDS). The multi-variate distribution assigned to each of the photons in the photon position map may be summed to predict a most probable location for the light source.

Method, system, and computer program product for localizing photons and a light source emitting the photons

Locations of the origins of the photons are acquired from a scanned sample with reference to a scan frame. The location on the sample from which a photon was emitted is inferred from the location of the scan as commanded by a scan drive signal, a feedback signal related to the position of the scan device, or alternatively by the point in time during a scan at which the photon is detected. A position function, e.g., photon probability density, is associated with a photon position. Summing or other processing of photon probability density functions can require fewer photons to converge to an ideal density distribution associated with an image feature than are required using conventional pixel binning. Stored data can be mapped into pixels or voxels of a display or otherwise processed. Original data remains available in the digital storage for post-hoc analysis. Imprecision introduced by the display process need not adversely affect the precision of the collected data.

Photon event distribution sampling apparatus and method

Locations of the origins of 'discrete events,' e.g., photons or other units of radiant energy are acquired from a specimen with reference to a scan frame or other region of interest of the specimen. The location of origin of a discrete event can be determined from the corresponding location datum as derived from a scan-drive signal, a positional feed-back signal, or by a point in time during a unit of sampling time ('image-acquisition period') at which the event is detected. A probability-density function (PDF) is associated with the detected locations. Summing or other processing of the PDFs is performed to produce imagable data. From the data, images can be produced that require fewer discrete events to converge to an ideal density distribution associated with an image feature than required by pixel-based binning methods. Stored data can be mapped into pixels or voxels of a display or otherwise processed, including post hoc processing.

Discrete event distribution sampling apparatus and methods

Dual axis, beam-steering devices are disclosed. An exemplary device includes a support platform having a top surface. A reflective surface is coupled to the top surface of the support platform. First and second galvanometers are coupled via respective linkages to the support platform such that the first galvanometer rotates the support platform about a first rotational axis, and the second galvanometer rotates the support platform about a second rotational axis that is orthogonal to the first rotational axis. The support platform can be simultaneously rotated with respect to both the first rotational axis and the second rotational axis to steer a beam of electromagnetic energy (e.g. light beam) reflected by the reflective surface.

Method and apparatus for two-axis, high-speed beam steering

A method and apparatus for performing data collection within a device is disclosed. A device steers a scanning probe in a continuous, non-raster pattern across a specimen. The specimen is supported by a stage, and data is collected in response to interaction between the probe and the specimen to form a data set. Spiral scanning patterns without turnaround regions are utilized in embodiments of the present invention, both with and without rounded corners in the scanning patterns.

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Reno, NV, United States of America

John Sutko