Growing community of inventors

Commack, NY, United States of America

John Steven Madsen

Average Co-Inventor Count = 4.53

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 39

John Steven MadsenJerrell Anthony Nardiello (8 patents)John Steven MadsenRobert J Christ (6 patents)John Steven MadsenStephen J Engel (3 patents)John Steven MadsenJohn M Papazian (3 patents)John Steven MadsenJohn Abraham Crawford (3 patents)John Steven MadsenElias L Anagnostou (2 patents)John Steven MadsenGeorge W Gilchrist (1 patent)John Steven MadsenCharles J Weizenecker (1 patent)John Steven MadsenSkylar Blaiz Cobb (1 patent)John Steven MadsenScott W Shaffar (1 patent)John Steven MadsenJohn Steven Madsen (8 patents)Jerrell Anthony NardielloJerrell Anthony Nardiello (12 patents)Robert J ChristRobert J Christ (8 patents)Stephen J EngelStephen J Engel (20 patents)John M PapazianJohn M Papazian (20 patents)John Abraham CrawfordJohn Abraham Crawford (4 patents)Elias L AnagnostouElias L Anagnostou (2 patents)George W GilchristGeorge W Gilchrist (4 patents)Charles J WeizeneckerCharles J Weizenecker (3 patents)Skylar Blaiz CobbSkylar Blaiz Cobb (1 patent)Scott W ShaffarScott W Shaffar (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Northrop Grumman Systems Corporation (8 from 3,385 patents)


8 patents:

1. 11209345 - Automatic prognostic qualification of manufacturing products

2. 10913239 - Veil based composite structure repair

3. 10173410 - Device and method for 3D printing with long-fiber reinforcement

4. 9962956 - System and method for onboard data tracking

5. 9541507 - Color-based foreign object detection system

6. 7770276 - Device and method for sequentially cold working and reaming a hole

7. 7559233 - Method for surface replication via thermoplastic media

8. 7377181 - In-situ large area optical strain measurement using an encoded dot pattern

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12/16/2025
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