Kulicke and Soffa Industries, Inc.

Sv Probe Pte. Ltd.

Antares Advanced Test Technologies, Inc.

John Shuhart

Horst Clauberg

Jon W Brunner

Timothy L Kraynak

Scott R Williams

Guy Frick

Alan Slopey

An electrode for a wire bonding apparatus is provided. The electrode includes a body portion and a tip portion adjacent the body portion. The tip portion has a substantially spherical configuration.

Electronic flame-off electrode with ball-shaped tip

An electrical conductor comprises a compressible conductive member and a tubular conductive sleeve, wherein the sleeve includes an internal deformation. The compressible member comprises a tubular lattice of interlaced wires received axially within the sleeve and engaged therein by the internal deformation to retain the compressible member axially within the sleeve.

Crimped tube electrical test socket pin

A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.

Stacked tip cantilever electrical connector

Growing community of inventors

Warminster, PA, United States of America

John Shuhart