General Electric Company

John Robert Brehm

Francis Howard Little

Kristina H Hedengren

Douglas S Steele

David W Oliver

Thomas William Birdwell

Charles Robert Wojciechowski

Ralph Gerald Isaacs

Andrew Joseph Galish

Rudolph A Koegl

Joseph Czechowski, Iii

George Edward Williams

Joseph Manuel Portaz

Ronald Cecil McFarland

Kevin Layne Moermond

Theodore W Sippel

Joseph J Sostarich

Henry J Scudder, Iii

John P Keaveney

Thomas G Kincaid

Andy Joseph Galish

James W Schuler

Larry C Howington

Michael Timothy La Tulippe

James M Brown, Jr

Dean Fredrich Graber

Richard D Miller

A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.

Method and system to inspect a component

An X-ray inspection system includes an X-ray source that generates more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and structure for supporting an object between the X-ray source and the X-ray detector. The X-ray source includes an electron gun and a device for steering an electron beam generated by the gun to multiple focal spots on a target.

Multiple focal spot X-ray inspection system

An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.

X-ray inspection system

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Middletown, OH, United States of America

John Robert Brehm