Siemens Corporate Research & Support, Inc.

John R Michener

An electron beam tester (11) utilizes a source (13) of stored electrons to produce a probing beam (14) of short pulses and high intensity. The high intensity improves the signal-to-noise ratio of the potential being measured and is especially suited for measuring potentials in high speed integrated circuits (19) while they are operating. The cyclotron principle is adapted for storing the electrons in an orbital configuration wherein the electrons are clustered in bunches having substantially the same energy level. These characteristics of the electrons in a beam facilitate its operation and control in an electron beam tester for contactless monitoring of voltage potentials in an operating high speed integrated circuit.

Electron storage source for electron beam testers

A security unit is disclosed for controlling access to a main computer system. The security unit provides a comprehensive mechanism for detecting and inhibiting sophisticated attackers. A method of operation and special purpose hardware for implementing this operation are disclosed.

Method and apparatus for securing access to a computer facility

A bistable multivibrator circuit responds to the voltage across a device to be protected. The circuit changes its state when this voltage drops below a predetermined value.

Growing community of inventors

Princeton, NJ, United States of America

John R Michener