Koninklijke Philips Corporation N.V.

Philips Electronics North America Corporation

John Petruzello

Balasundar Iyyavu Raju

Shriram Sethuraman

Ajay Anand

Thomas M Marshall

Junbo Li

The invention relates to a temperature distribution measuring apparatus for measuring a temperature distribution within an object caused by heating the object. A temperature distribution measuring unit () measures the temperature distribution in a measurement region within the object, while the object is heated, and a temperature measurement control unit () controls the temperature distribution measuring unit such that the measurement region is modified depending on the measured temperature distribution, in order to measure different temperature distributions in different measurement regions. This allows, for example, modifying the measurement region depending on an actually measured temperature distribution such that in the modified new measurement region the measurement of the temperature of the object can be continued, if the temperature actually measured in the current measurement region is too high for being accurately measured, thereby extending the time period in which a temperature distribution of the object can be measured.

Temperature distribution determining apparatus

A II-VI semiconductor device has a p-doped quaternary ZnMgSSe layer formed of undoped sublayers and p-doped sublayers.

Semiconductor device comprising p-type ZnMgSSe layer

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Carmel, NY, United States of America

John Petruzello