Waikatolink Limited

John Peter Godbaz

Adrian Andrew Dorrington

Michael John Cree

An apparatus for measuring intensity and/or range characteristics of an object(s), comprising: a signal source to emit modulation signals at a frequency(s); an illuminator to illuminate the object(s) by a first modulation signal; a sensor comprising a pixel(s), wherein the sensor creates a sampled correlated signal by sampling the correlation of a backscattered signal with a second modulation signal within the pixel; and a processor to determine range/intensity characteristics of component returns within the pixel(s) by comparing sampled correlated signals using measurements(s), wherein the measurement(s) comprise first and second modulation signals having a characteristic(s) selected from: (a) two or more different modulation frequencies, (b) a different modulation frequency(s) and an offset of the correlation waveform, and (c) another different modulation frequency(s) and one selected from: the zeroth spatial frequency of the signal returns versus range and an approximation of the zeroth spatial frequency of the signal returns versus range.

Growing community of inventors

Hamilton, New Zealand

John Peter Godbaz