Sandisk Corporation

John Pasternak

Yongliang Wang

Nima Mokhlesi

A step down voltage regulator with bypass comprised of devices designed to operate over a maximum rated voltage lower than a supply voltage. The regulator includes an output regulation device coupled to the supply voltage and an output. An output device protection circuit is provided which is responsive to the supply voltage and the output to ensure that the maximum rated voltage of the output regulation device is not exceeded. A bypass circuit having a bypass output device and being coupled to the supply voltage is provided with a protection circuit. The output regulation devices comprise p-channel transistors, and may have an operating maximum rated voltage in a range of 2.7-3.6 volts with the supply voltage is in a range of 4.4-5.25 volts, or 2.9-3.5 volts.

Voltage regulator with bypass mode

A system and method for supplying power to a peripheral device where the voltage supplied by a host device may be the voltage required for operation of the peripheral, or a higher voltage. A memory system includes a voltage regulator including an input, and output and a bypass shorting the input to the output. A voltage detector communicates with the regulator. A Bypass enable signal operable responsive to a signal generated by the host device indicating that the power up of the host is complete is coupled to the bypass element. A method for operating a voltage regulator in a memory system includes the steps of: providing a voltage regulator having an input and an output, and including a bypass shorting the input to the output; setting the bypass to off prior to power up of a host device; responsive to a power up completion signal from a host device, determining the power supplied by the host; and if the power supplied by the host is below a threshold operating voltage, enabling the bypass.

Voltage regulator with bypass for multi-voltage storage system

A step down voltage regulator including devices designed to operate over a maximum rated voltage lower than the supply voltage. The regulator comprises an output regulation device coupled to the supply voltage and an output; and an output device protection circuit responsive to the supply voltage and the output to ensure that the maximum rated voltage of the output device is not exceeded. Also provided is a method for operating a voltage regulator in a memory system. The method includes the steps of: providing a voltage regulator having an input and an output, and including a plurality of devices operating at a maximum rated voltage less than the voltage provided at the input; and controlling the gate voltage of the output device responsive to a load on the regulator output, so that the maximum rated voltage is not exceeded.

Voltage regulator using protected low voltage devices

A system and method for quickly and efficiently programming hard-to-program storage elements in non-volatile integrated memory devices is presented. A number of storage elements are simultaneously subjected to a programming process with the current flowing through the storage elements limited to a first level. As a portion of these storage elements reach a prescribed state, they are removed from the set of cells being programmed and the current limit on the elements that continue to be programmed is raised. The current level in these hard-to-program cells can be raised to a second, higher limit or unregulated.

System and method for programming cells in non-volatile integrated memory devices

Techniques for producing and supplying various voltage levels within a memory system having multiple memory blocks (e.g., memory chips) are disclosed. The various voltage levels can be produced by charge pump and regulator circuitry within the memory system. The various voltage levels can be supplied to the multiple memory blocks through a power bus. According to one aspect of the invention, charge pump and regulator circuitry is not only provided within each of the memory blocks of a memory system, but also the charge pump and regulator circuits are not used to supply voltage signals to their own memory blocks. Instead, the charge pump and regulator circuits are used to supply voltage signals to other memory blocks.

Method and system for distributed power generation in multi-chip memory systems

A technique for controlling the soft-program current in virtual-ground FLASH memory arrays is described. It is based on biasing the array bit-lines such that all current supplied to the array is used entirely towards the soft-programming of selected cells. The result is control of the soft-programming current and the programming rate of individual cell pairs. The benefit of soft-programming is then realized during the actual cell programming with the improved control of current and program rate. This is described with respect to an embodiment that uses source-side injection as the means for programming memory cells and with respect to a second embodiment based on a cell with dual floating gates.

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Santa Clara, CA, United States of America

John Pasternak