Faz Technology Limited

Optics11 Faz Limited

John O'Dowd

Roger Maher

Tom Farrell

Devrez Mehmet Karabacak

Selwan K Ibrahim

Vivian Bessler

Martin Farnan

John Dunne

Lymperis Voudouris

Ibrahim Selwan

The present invention provides a method for measuring an optical sensor system comprising an array of intrinsic fiber optic sensors at an interrogator comprising an optical source and an optical detector. The method comprises the steps of emitting an optical signal to an array of intrinsic fiber optic sensors; detecting optical responses to the emitted signal from the sensors; associating each detected optical response with an individual sensor by determining within which region among a plurality of detection regions assigned to the individual sensors the optical response is detected wherein each detection region corresponds to a wavelength range in the bandwidth of the optical sensor system; and performing signal processing on each optical response to measure the value of the physical parameter detected by its associated sensor. A calibration of the detection region assigned to each sensor is performed at predetermined intervals.

System and method for interrogating an intrinsic fiber optic sensor

A system and method of determining the center of a peak of data points of an optical sensor are disclosed. The method can comprise the steps of performing an initial setup measurement of the sample points and extracting a peak; fitting the peak with a function that uses at least one of the peak's width, amplitude and center offset as fitting parameters; producing a set of linear equations which when solved calculate the optimum fit of a function to the peak assuming the previously calculated peak's width; and performing subsequent measurements of the data points to find peaks and solving the set of linear equations to determine the center of the peaks.

Method and system for tracking the centre of a peak from a plurality of sample points in an optical system

The invention provides a measurement system to interrogate at least one birefringent optical sensor and a method to interrogate birefringent optical sensors at high speed and high resolution. The system and method detects, at least, a first and a second spectral feature that are polarization dependent, wherein the detected first and second spectral features correspond to different responses of at least one birefringent optical sensor.

Measurement system and method to interrogate birefringent optical sensors with a frequency swept source based interrogator

The invention provides a dynamically swept tunable laser system and method for measuring sensor characteristics obtained from an array of optical sensors comprising means for dividing the total wavelength sweep of the laser into different regions in any particular order where each region contains single or multiple contiguous sweep segments and where each sweep segment is referenced by a start and a stop reference and can have different lengths compared to the other sweep segments. The sensor characteristics are determined from each region swept by the tunable laser. The invention provides for the tunable laser to be adapted to operate in a quasi-continuous mode to select segments in any order. The relative sweep rates of regions can be changed such that some regions can be swept more times than other regions.

System and method for dynamically sweeping a tunable laser

The invention provides a system and a method for wavelength referencing and polarization mitigation. An optical wavelength tunable laser source is swept in a number of contiguous, overlapping sweep segments. A coarse reference wavelength section produces a reference signal that defines at least one absolute wavelength within a sweep segment. A fine wavelength reference section produces a periodic wavelength reference signal that defines a plurality of equidistant wavelengths within each sweep segment with an indeterminate offset relative to the absolute wavelength(s) of the coarse reference wavelength section. The free spectral range of the fine wavelength reference section is smaller than the spacing between subsequent absolute reference wavelengths of the coarse reference wavelength section. This arrangement allows reducing the minimum required overlap between contiguous sweep segments.

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Dublin, Ireland

John O'Dowd