Texas Instruments Corporation

Zyvex Labs, LLC

Other

Sso Venture Partners, LLC

University of Texas System

Zyvex Corporation

Nano-retina, Inc.

John Neal Randall

Gary A Frazier

Rahul Saini

Joshua B Ballard

Kenneth W Page

Ehud Fuchs

Thomas J Aton

George Dee Skidmore

Robert J Folaron

Shane R Palmer

Christof Baur

Richard E Stallcup

Dejan Jovanovic

James H G Owen

Jun-Fu Liu

Jingping Peng

Christian H Seidler

Mark Stephen Rodder

Steven Roy Julien Brueck

Manoj Mehrotra

Daniel F Feezell

Alan C Seabaugh

Andrew J Purdes

Rajni J Aggarwal

John Charles Wolfe

Denis E Keyes

Matthew D Ellis

Tito Busani

Mahmoud Behzadirad

Seyed Omid Reza Moheimani

Douglas J Weaver

Gerhard Maale

Ashwin Krishnan Rishinaramangalam

James R Von Ehr

Gene E Fuller

James Owen

Yung Chung Kao

David P Stumbo

James R Wooley

William H Fagan

Bryan D Smith

Joseph Lake

Charles D Gray, Jr

Farid Tajaddodianfar

A sensor suitable for detecting specific analytes, a method for manufacturing the sensor, and a method for using the sensor in a diagnostic procedure provided. In an embodiment, the sensor device includes a substrate, a dielectric layer disposed on the substrate, and a probe layer disposed on the dielectric layer. The probe layer is configured to react with an analyte. The reaction may include: binding with the analyte, undergoing a change in a chemical property of the probe layer, or undergoing a change in a structural property of the probe layer. In examples, an attribute of the dielectric layer is configured to identify the device during a process that determines whether the probe layer has reacted with the analyte.

Sensor device for biosensing and other applications

Provided is a composite metal-wide-bandgap semiconductor tip for scanning tunneling microscopy and/or scanning, tunneling lithography, a method of forming, and a method for using the composite metal-wide-bandgap semiconductor tip.

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) system to receive a sample having a surface to be patterned. The system positions a conductive tip over a pixel region of the surface. While the conductive tip remains laterally fixed relative to the surface, the system applies a bias voltage between the conductive tip and the surface such that a current between the conductive tip and the surface removes at least one atom from the pixel region. The system stops applying the voltage and current when it senses the removal of the at least one atom. The system then verifies that the at least one atom has been removed from the pixel region.

Depassivation lithography by scanning tunneling microscopy

Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.

Methods, devices and systems for scanning tunneling microscopy control system design

A multi-electrode array with individually isolated electrodes each configurable for a target-containing carrier and a method for fabricating the array are disclosed. In an exemplary embodiment, the array includes a substrate; and a plurality of electrodes disposed on the substrate. Each electrode of the plurality of electrodes has a conductive tip-end and an insulated remainder. A first electrode of the plurality of electrodes has a first configuration selected to bring a conductive tip end of the first electrode in proximity to a first target structure, and a second electrode of the plurality of electrodes has a second configuration selected to bring a conductive tip end of the second electrode in proximity to a second target structure. The first configuration and the second configuration are different. A first contact of the plurality of contacts may be electrically coupled to the first electrode through the substrate.

Three-dimensional multi-electrode array

A method of pointillist painting includes receiving a dot list including a specification of color, position, size, texture, and exclusion zone of a plurality of dots, wherein the exclusion zone of a dot represents an area that does not overlap with an exclusion zone of any other of the plurality of dots and selecting a first set of dots of a first color. A colorant dispenser may be moved to a first position of a first dot in the first set. A pre-determined amount of colorant may be applied to the first position. A measured blast of air may modify coverage and profile of the applied colorant. The dispenser may then move to the remaining positions until all dots of the first color and subsequent sets of dots of subsequent colors are dispensed.

System and method of pointillist painting

Method of fabricating a multi-electrode array

Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) to remove portions of a monolayer of atoms or molecules from a crystalline surface to form atomically precise structures. The STM is utilized to both image the sample and remove the desired portions of the monolayer of atoms or molecules. In some instances, the lattice structure of the crystalline surface is utilized as a coordinate system by a control system of the STM to facilitate the automated removal of specific atoms or molecules from the crystalline surface.

Methods, devices, and systems for forming atomically precise structures

A method of generating a textured pointillist painting design comprises receiving a digital image file including a specification of a plurality of pixels representative of a digital image, the pixels each including a color definition, creating an ordered list of color definitions of the plurality of pixels in the digital image file, for each color definition in the ordered list determining a set of design parameters including: a dot size, a dot shape, a dot exclusion zone size, and a dot distribution scheme, for each color definition, determining a placement of a plurality of dots according to the pixels and color definitions in the digital image file and the set of design parameters, generating a dot list specifying the placement and design parameters of the plurality of dots representative of the digital image, and rendering on a display a facsimile image in response to the dot list.

System and method of pointillist painting design

A system of pointillist painting comprises an automated 3-D positioning system disposed proximate a painting surface, a colorant dispenser coupled to the gantry structure and having a dispensing tip in fluid communication with a colorant chamber, the gantry structure operable to move the colorant dispensing tip to a specified position of the painting surface, where the colorant dispenser is operable to apply a specified amount of a colorant to the painting surface and creating a dot having a two-dimensional coverage and three-dimensional profile at the specified position.

A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.

Patterned atomic layer epitaxy

A fluid dispensing apparatus is configured to dispense a predetermined volume of fluid, and includes a fluid reservoir to hold a fluid to be dispensed, a dispense tube to dispense the fluid, and an elevator mechanism. The fluid reservoir receives a fluid from a fluid supply. A dispense tube has a dispense outlet, and is connected to an outlet port on the fluid reservoir. The elevator mechanism changes a relative vertical displacement between the dispense outlet and the outlet port, such that the fluid is dispensed when the dispense outlet is lower than the outlet port, and not dispensed when the dispense outlet is higher than the outlet port.

Fluid dispensing apparatus

A mechanism and method for depositing oil paints, acrylics, or other textural paints provides a means for automating the process of painting a picture. The process can be programmed into a data base which is stored and used at will, or the artist can utilize control means such as a joy stick to provide real-time input.

Mechanism for applying paint to canvas

A deflection element operating under control of selectively applied energy is used to achieve low insertion loss between mating elements. Once the elements are in proper relationship the deflection element is allowed to settle to its stable position thereby serving to lock the elements together.

Self-actuating connector for coupling microcomponents

Growing community of inventors

Richardson, TX, United States of America

John Neal Randall