Ge Inspection Technologies, Gmbh

General Electric Company

John Michael Cuffe

Scott Allen Herbster

David Michael Hoffman

Steven Jude Duclos

Clifford Bueno

James Norman Barshinger

Ying Fan

Klaus-Peter Busch

Klaus Peter Busch

A method for performing ultrasonic testing comprising, in one embodiment, the steps of firing an ultrasonic transducer to generate an ultrasonic pulse that passes through a delay line, measuring a delay echo time of flight, and determining the temperature of the delay line using the delay echo time of flight, thereby eliminating the need for additional temperature measuring devices. Other embodiments further comprise the step of using the temperature of the delay line to determine the temperature of a test object, and using the temperature of the test object to determine a thickness of the test object that is compensated for thermal expansion and temperature dependent ultrasonic velocity.

Method for performing ultrasonic testing

A phosphor admixture includes a phosphor powder and a number of radiation capture electron emitters. The emitters are dispersed within the phosphor powder. A phosphor screen includes phosphor particles, radiation capture electron emitters and a binder. The emitters and phosphor particles are dispersed within the binder. An imaging assembly includes a phosphor screen configured to receive incident radiation and to emit corresponding optical signals. An electronic device is coupled to the phosphor screen. The electronic device is configured to receive the optical signals from the phosphor screen and to generate an imaging signal.

Phosphor screen and imaging assembly

The invention provides an ultrasonic object inspection system for measuring the physical properties of a test object which includes a pulse generator for sending an electrical pulse signal to a transducer. The transducer then applies an ultrasonic signal to the test object and receives an ultrasonic echo signal from the test object which is then converted by the transducer to an electrical echo signal for sending to a signal processing circuit. The signal processing circuit includes a plurality of signal processing paths with each path scaling the electrical echo signal to a different degree and including a respective analog to digital converter for converting the electrical echo signal to a digital electrical echo signal. The signal processing circuit further includes a logic circuit for selecting the output of the respective analog to digital converter that provides the digital echo signal having the greatest amplitude without exceeding a predetermined saturation threshold.

Digital log amplifier for ultrasonic testing

The apparatus and method of the present invention provides a plurality of linear amplifiers simultaneously processing an ultrasonic signal. Each amplifier of the plurality of linear amplifiers has a predetermined gain level suitable for achieving the desired output signal level for input to an analog to digital (A/D) converter for processing. The output of each amplifier is sampled by each respective A/D converter at a very high frequency to convert the analog signal output of each of the linear amplifiers to a digital signal. Logic circuits simultaneously monitor all of the output digital signals from the A/D converters. The logic circuits determine which output of the A/D converters has the greatest linear output and stores the selected output in a memory storage device. The saved output waveforms are subsequently combined into a continuous linear digital output that has a dynamic response range that is approximately the sum of the individual dynamic response ranges of the individual amplifiers and A/D converters. The combined continuous linear digital output waveform may be input to a logarithmic conversion to produce a waveform having a wide dynamic range.

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Reedsville, PA, United States of America

John Michael Cuffe