Rika Electronics International, Inc.

Rika Denshi America, Inc.

Kita USA

Southwest Test Inc.

John M Winter

Larre H Nelson

John C Bergeron

Lourie M Sarcione

Yoshihide Kimura

Robert A Morin

James R Aussant

A device for testing integrated circuits utilizing a compression spring that has one longitudinal centerline that is concentric to the housing of the test probe and terminates in a number of reduced diameter coil windings that are non-concentric to the housing so as to provide a side load to the probe.

Biasing method and device construction for a spring probe

Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.

Electrical test probes with a contact element, methods of making and using the same

A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Apparatus for interfacing electronic packages and test equipment

Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.

Electrical test probes, methods of making, and methods of using

An electrical socket ( ) mounts a plurality of electrical contact probes ( ) for providing an electrical connection between terminals of an electronic package ( ) received in a seat ( ) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip ( ) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface ( ) for interengagement with a removable retainer member of the socket.

Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition

A counterforce spring assembly for printed circuit board test fixtures is provided. A number of counterforce spring assemblies are provided in an array between the top plate and probe plate of the test fixture. Each counterforce spring assembly includes a support cup residing in an aperture through the probe plate. A compression spring resides in the support cup and provides spring-biasing of the top plate to the probe plate during the UUT testing cycle. Each counterforce spring assembly includes a circumferential flange to limit downward travel of the top plate toward the probe plate. Each assembly is small enough to fit between probe apertures corresponding to component leads of the UUT. The counterforce spring assemblies can be freely placed underneath the top plate to provide even spring-biasing thereof to prevent bowing and bending of the top plate which often causes errors in the testing of printed circuit boards.

Growing community of inventors

Wrentham, MA, United States of America

John M Winter