Dow Global Technolgoies LLC

Rohm and Haas Company

John Lund

Donald L McCarty, Ii

Hitendra Singh

Brayden E Glad

Paul A OConnell

Erick Sutanto

Cornelis F J Den Doelder

Peter Hermann Roland Sandkuehler

Kurt A Koppi

Larry Dotson

Sanjay C Solanki

Jin Wang

Eric L Marchbanks

Scott J Collick

Christopher M Thurber

Birgit Braun

Colleen M Southwell

Marc M J Dees

Jonathan J Zieman

William E Gee

Sylvie Vervoort

Donald L Ii Mccarty

Donald L Mccarty Ii

Paul Oconnell

A rheology system includes a rheometer including a lower plate and an upper plate, a manipulator including an arm, a loading end effector, a cleaning end effector, and a controller communicatively coupled to the rheometer and the manipulator, the controller including a processor and a computer readable and executable instruction set, which when executed, causes the processor to direct the manipulator to couple the loading end effector to the arm, direct the manipulator engage a specimen with the loading end effector, direct the manipulator to position the specimen on the lower plate of the rheometer, direct the upper plate to engage the specimen between the upper plate and the lower plate, direct the manipulator to couple the cleaning end effector to the arm, and direct the manipulator to engage the lower plate with the cleaning end effector.

Rheology testing systems and methods for operating the same

A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.

System for tensile testing films

A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.

System for analyzing impact and puncture resistance

A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.

Device for analyzing impact and puncture resistance

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Midland, MI, United States of America

John Lund