Wentworth Laboratories Limited

John Joseph Fitzpatrick

Jeremy Hope

Adrian R Overall

John Bysouth

A probe head for testing the properties of a semiconducting device () under test including a dielectric film () supporting at least one semiconducting device () under test with a support frame () tautly supporting the dielectric film (). A first support () positions a first probe () for electrically contacting a first side () of the semiconducting device () under test and a second support (), having a actuator to move a second probe () between a first position (P) and a second position (P), positions second probe () with the second position (P) being for electrically contacting an opposing second side () of the semiconductor device under test.

Double side probing of semiconductor devices

The device () picks up and aligns a sawframe () for handling and aligning silicon wafers (). The device () includes at least one resiliently moveable locating arm () which is adapted to engage co-operably with a notch () on the periphery of the sawframe () when the device () is moved into contact therewith. The sawframe () is thus urged into alignment with the device (), and may be held in position relative to the device ().

Growing community of inventors

Woburn Sands, United Kingdom

John Joseph Fitzpatrick