Advanced Micro Devices Corporation

Zynga Inc.

John Huan Vu

Nhon T Do

Danica Milosevic Brinton

Bigi Lui

Eric Matsumura

John W Pursel

An apparatus and method providing a localization framework capable of localizing dynamic text is disclosed herein. The localization framework is configured to automatically identify and prioritize certain text contained within an application code base to be translated. Such text is pre-processed prior to translation to facilitate accurate and complete translation in a target language.

Localization framework for dynamic text

A test fixture with an isolation plate grounds all of the solder balls of a ball grid array (BGA) of a chip scale package, except for a selected subset of the solder balls, to perform electrical characterization of the package. The isolation plate includes a recess ground into the plate, and a hole in the recess that permits access to the selected subset of solder balls. The recess provides clearance for a fixed compliant probe to land on the solder balls to be tested through the hole, and a probe contact surface for a ground portion of the probe to securely land.

Chip scale electrical test fixture with isolation plate having a recess

A test fixture with an isolation plate grounds all of the solder balls of a ball grid array (BGA) of a chip scale package, except for a selected subset of the solder balls, to perform electrical characterization of the package. The isolation plate includes at least one hole extending through the isolation plate that exposes the selected subset of the electrical contacts. The hole has a sidewall angled at a non-perpendicular angle from the horizontal plane of the isolation plate. The angle sidewall of the hole provides increased clearance for a fixed compliant probe to land on the solder balls to be tested in an electrical characterization process.

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San Jose, CA, United States of America

John Huan Vu