Quantum-si Incorporated

Lithoptek LLC

John Glenn

Paul E Glenn

Jonathan Marc Rothberg

Keith Glen Fife

Todd Rearick

Jack L Jewell

Lawrence Camest West

Jeremy Christopher Jordan

Jason W Sickler

Jonathan C Schultz

Farshid Ghasemi

Faisal R Ahmad

Jose Camara

Benjamin Cipriany

Rudolf H Hendel

Mark L Schattenburg

Apparatus and methods for producing ultrashort optical pulses are described. A high-power, solid-state, passively mode-locked laser can be manufactured in a compact module that can be incorporated into a portable instrument. The mode-locked laser can produce sub-50-ps optical pulses at a repetition rates between 200 MHz and 50 MHz, rates suitable for massively parallel data-acquisition. The optical pulses can be used to generate a reference clock signal for synchronizing data-acquisition and signal-processing electronics of the portable instrument.

Compact mode-locked laser module

Apparatus and methods for producing ultrashort optical pulses are described. A high-power, solid-state, passively mode-locked laser can be manufactured in a compact module that can be incorporated into a portable instrument for biological or chemical analyses. The pulsed laser may produce sub-100-ps optical pulses at a repetition rate commensurate with electronic data-acquisition rates. The optical pulses may excite samples in reaction chambers of the instrument, and be used to generate a reference clock for operating signal-acquisition and signal-processing electronics of the instrument.

Pulsed laser and bioanalytic system

A method and apparatus for treating a substrate and, in particular, making secondary adjustments to the results of a primary process applied to the substrate, leading to improved uniformity of the overall process, in which a substrate is positioned on a substrate holder; a scanning a beam of light is directed onto the surface of the substrate; and the amplitude of the scanned beam is varied by location based on a substrate signature.

Apparatus and method for using scanning light beam for film or surface modification

A method and apparatus in which retroreflective materials and surfaces are used for determining the position, orientation and scale of work pieces in order to accurately place process beams thereon for the purpose of surface patterning or treatment.

Detection of position, orientation and scale of work pieces using retroreflective surfaces

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Carlisle, MA, United States of America

John Glenn