USA As Represented by Secretary of the Navy

John G Miskimins

Gary L Combs

Michael J Kroger

Ahmed S Zaki

William H Slater

Ronald J Battles

Christopher C Moll

John H Holman

Dennis F Frey

A method for reducing bias drift in electrical-mechanical systems sensor such as an accelerometer is provided. The method includes the steps of arranging at least one accelerometer in a chamber and initiating a plurality of temperature cycle sets. Each temperature cycle set has a minimum temperature, a maximum temperature, and a ramp rate. The conditioning method monitors the accelerometers until a bias drift is stabilized within a desired bias drift range. The minimum temperature and the maximum temperature limit a temperature range in which the accelerometer is cycled. Use of temperature limiting can quickly accelerate stabilization of the bias drift while also reducing degradation.

Method for reducing bias drift in a microelectromechanical systems sensor

A multiconductor continuity and intermittent fault analysis system that subjects the cable to controlled environmental stress stimuli, such as vibration at a plurality of frequencies simultaneously, during testing. Multiconductor cables used for the transmission of digital data and control signals include multiple individual conductors terminating at both ends in pins or sockets that are grouped together in a connector. Physical defects in these cables can be permanent, or they can be intermittent faults, such as temporary breaks or shorts caused by vibrational stress on the cables. By vibrating the cable under test and measuring continuity rapidly enough to detect short-term anomalies, even intermittent faults are located. A distributed processing embodiment disclosed uses a user interface unit such as a personal computer or personal digital assistant, a multiprocessor controlled control unit, and the dynamic stimulation unit. The control unit includes a plurality of processors operating independently to test a plurality of cable pins simultaneously.

Multiconductor continuity and intermittent fault analyzer with distributed processing and dynamic stimulation

A multiconductor continuity and intermittent fault analysis system that sects the cable to controlled environmental stress stimuli, such a vibration at controlled frequencies, during testing. Multiconductor cables used for the transmission of digital data and control signals include multiple individual conductors terminating at both ends in pins or sockets that are grouped together in a connector. Physical defects in these cables can be permanent, or they can be intermittent faults, such as temporary breaks or shorts caused by vibrational stress on the cables. By vibrating the cable under test and measuring continuity rapidly enough to detect short-term anomalies, even intermittent faults are located.

Multiconductor continuity and intermittent fault analyzer with dynamic

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Port Hadlock, WA, United States of America

John G Miskimins