International Business Machines Corporation

Globalfoundries Inc.

Elpis Technologies Inc.

John Edward Sheets, Ii

David Paul Paulsen

Karl Robert Erickson

Phil Christopher Paone

Gregory John Uhlmann

Kelly Lynn Williams

Todd Alan Christensen

George Francis Paulik

Kirk David Peterson

David Howard Allen

Douglas Michael Dewanz

Gerald Keith Bartley

William Paul Hovis

Andrew Benson Maki

Terrance Wayne Kueper

Richard Lee Donze

Lawrence Alfred Clevenger

Baozhen Li

Philip Raymond Germann

Darryl John Becker

Paul Eric Dahlen

Jon Robert Tetzloff

Junli Wang

Mark Owen Maxson

Anthony Gus Aipperspach

Phil Christopher Felice Paone

Terry Allen Spooner

Raymond Alan Richetta

Chih-Chao Yang

Benjamin A Fox

Nathaniel James Gibbs

Trevor Joseph Timpane

Axel Aguado Granados

Robert E Kilker

Kangguo Cheng

Jack Allan Mandelman

Paul William Coteus

Alan G Gara

Eren Kursun

Travis Reynold Hebig

Derick Gardner Behrends

Chen-Yong Cher

Shurong Tian

Jeffrey Douglas Brown

Michael Launsbach

David M Onsongo

Brian Andrew Schuelke

Karl L Erickson

Louis L Hsu

Louis Lu-Chen Hsu

Jente Benedict Kuang

Daniel Lawrence Stasiak

Robert Russell Williams

Peter Thomas Freiburger

Matthew James Paschal

Andrew A Turner

Ronald Jay Bolam

Miles C Pedrone

Nathaniel R Chadwick

Eric Marz

Tassbieh Hassan

Christine Whiteside

Karl Robert Ericson

Gregory J Ulmann

Corey Elizabeth Yearous

Data relating to one or more circuit paths may be collected during a design stage of a processor chip based on a design model. One or more delta values may be added to the one or more circuit paths of the design model. One or more broken circuit paths may be identified based on the one or more delta values. A target time for each of the one or more broken circuit paths may be adjusted.

Processor chip timing adjustment enhancement

Real time cognitive reasoning using a circuit with varying confidence level alerts including receiving a first set of data results and a second set of data results; transferring a first unit of charge from a first charge capacitor on the A-B circuit to a collection capacitor on the A-B circuit for each of the first set of data results that indicates a positive data point; transferring a second unit of charge from a second charge capacitor to the collection capacitor for each of the second set of data results that indicates a positive data point; and triggering a first sense amp on the A-B circuit if the charge on the collection capacitor exceeds a first charge threshold, indicating that the positive data points in the first set of data results is greater than the positive data points in the second set of data results to a first statistical significance with a first confidence level.

Real time cognitive reasoning using a circuit with varying confidence level alerts

Embodiments are directed to a method for repairing features of a host semiconductor wafer. The method includes forming a feature of the host semiconductor wafer, wherein the feature includes a first conductive material and a surface having a planar region and non-planar regions. The method further includes forming a metal conductive liner over the non-planar regions. The method further includes applying a second conductive material metal layer over said the conductive liner. The method further includes recessing the second conductive material to be substantially planar with the planar region.

Metalization repair in semiconductor wafers

Optimizing data approximation analysis using low power circuitry including receiving a plurality of data bits each corresponding to a binary indication of a test result; placing each of the plurality of data bits on an approximation circuit, wherein each of the data bits is placed on the approximation circuit by applying, to a first capacitor during a set time period, a voltage corresponding to the data bit, and wherein placing each of the plurality of data bits on the approximation circuit results in a resulting voltage stored on the first capacitor; and determining a potential correlation of the test results by comparing the resulting voltage to a voltage threshold.

Optimizing data approximation analysis using low power circuitry

An integrated circuit (IC) can be configured to provide a managed power distribution to circuits within a plurality of regions of the IC. Each region of the plurality of regions can include a corresponding set of circuits that are electrically connected to a corresponding virtual power island (VPI) within said each region. A global power distribution structure within the IC can be configured to be electrically interconnected to an off-chip voltage supply. The IC can also include a plurality of sets of vertical interconnects (VIs), each set of VIs electrically interconnected to a VPI within a corresponding region. Each set of VIs can also be connected to the global power distribution structure, and can be used to provide a specifically managed voltage through a VPI to a set of circuits within a corresponding region of the IC.

Managed integrated circuit power supply distribution

According to an embodiment of the present invention, a method for forming contacts includes forming an oxide layer over and along a first liner layer. A first spacer layer is formed along the first liner layer opposing the oxide layer. A work function metal layer is formed along the first spacer layer opposing the first liner layer. A gate is formed on and along the work function metal opposing the first spacer. A second spacer layer is formed on the oxide layer. Portions of the oxide layer, the first liner layer, the first spacer, the work function metal layer and the second spacer layer are removed which forms a recess between the gate and the first spacer layer. A second liner layer is deposited in the recess. A low-resistance metal is deposited in the removed portions to form the first contact.

Low resistance contact for transistors

Cognitive analysis using applied analog circuits including receiving, by a circuit, a first set of data results and a second set of data results; charging a first capacitor on the circuit with a first unit of charge for each of the first set of data results that indicates a positive data point; charging a second capacitor on the circuit with a second unit of charge for each of the second set of data results that indicates a positive data point; applying a charge from the first capacitor and a charge from the second capacitor to an analog unit of the circuit; and generating a signal on a circuit output indicating that a ratio of the positive data points in the first set of data results to the positive data points in the second set of data results is greater than a statistical significance.

Cognitive analysis using applied analog circuits

A semiconductor device includes a first dielectric layer including a first contact hole, a second dielectric layer formed on the first dielectric layer, and including a second contact hole aligned with the first contact hole, and a reflowed copper layer formed in the first and second contact holes.

Semiconductor device and method of forming the semiconductor device

A negative-operand compatible subtractor circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a difference output node to a voltage proportional to a difference between two received N-bit binary numbers. The subtractor circuit includes two sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number 'n.' The subtractor circuit includes two sets of scaled capacitors, each capacitor of two sets of scaled capacitors electrically connected to the difference output node. Each scaled capacitor has a capacitance equal to 2*a unit capacitance (C). The subtractor circuit includes a reset circuit configured to draw, in response to a received RESET signal, the difference output node to ground. A control circuit of the subtractor is configured to, in conjunction with the reset circuit, draw the difference output node to a reset voltage.

Negative operand compatible charge-scaling subtractor circuit

A method of tailoring BEOL RC parametrics to improve chip performance. According to the method, an integrated circuit design on an integrated circuit chip is analyzed. The analysis comprises calculating Vmax for vias and metal lines in the integrated circuit design over a range of sizes for the vias and the metal lines. Predicted use voltage for applications on the integrated circuit chip is determined. The size or the location of at least one of the vias and the metal lines is tailored based on performance parameters of the integrated circuit chip.

Method of optimizing wire RC for device performance and reliability

A multiplier circuit can be fabricated within an integrated circuit and can draw a product output node to a voltage proportional to a product of first and second binary numbers received at two sets of inputs. The multiplier circuit includes a first set of scaled capacitors connected to an output of a multiplexor and to a local product output node. Each multiplexor is connected to a second set of scaled capacitors configured to generate an analog voltage in proportion to the value of the first binary number. Each scaled capacitor of first set of scaled capacitors has a capacitance proportional to a significance of a respective bit of the second binary number. The multiplier circuit includes a reference capacitor connected to ground and the product output node, and a reset circuit configured to draw, in response to a RESET signal, the product output node to ground.

Charge-scaling multiplier circuit with dual scaled capacitor sets

Real time cognitive monitoring of correlations between variables including receiving, by a circuit, a first set of data results and a second set of data results, wherein each set of data results comprises binary data points; adding a unit of charge to a collection capacitor on the circuit for each of the first set of data results that indicates a positive data point; removing a unit of charge from the collection capacitor for each of the second set of data results that indicates a positive data point; and triggering a first sense amp on the circuit if the charge on the collection capacitor exceeds a high charge threshold, indicating that the positive data points in the first set of data results is greater than the positive data points in the second set of data results to a first statistical significance.

Real time cognitive monitoring of correlations between variables

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Zumbrota, MN, United States of America

John Edward Sheets, Ii