University of Utah Research Foundation

Sarcos Group

Sarcos Corp.

John E Wood

Stephen C Jacobsen

Michael G Mladejovsky

Richard H Price

Clark C Davis

David L Wells

Richard P Phillips

Displacement measuring apparatus for measuring the displacement and movement of an object includes a sensor having an operative surface and circuitry for producing an electrical output signal whose value is dependent upon the area of the operative surface covered by an electrical/magnetic field producing member. The apparatus also includes an elongate, flexible band capable of producing an electric/magnetic field, where the band is attached at one end to the sensor to roll over and cover or unroll from over and uncover the operative surface as the object whose displacement is to be measured is moved. The value of the electrical output signal produced by the circuitry is thus dependent upon the area of the operative surface covered by the band and thus by the position and movement of the object.

Mechanical/electrical displacement transducer

Displacement measuring apparatus for measuring the displacement and movement of an object includes an array of sensors having an operative surface and circuitry for producing an electrical output signal whose value is dependent upon the disposition of an electrical/magnetic field producing member along the sensor array. The field producing member is disposed to contact and slide over the operative surface as the object whose displacement is to be measured is moved. The value of the electrical output signal produced by the circuitry is thus dependent upon the position of the field producing member along the sensor array and thus by the position and movement of the object.

Sliding contact mechanical/electrical displacement transducer

A field-based movement sensor adapted for measuring strain along a certain axis in an object on which the sensor is attached. The sensor includes a substrate having a working surface and formed with a pair of fingers projecting from a first direction, and a third finger projecting from a direction oppposite the first direction, to a position between the pair of fingers. The pair of fingers and third finger extend generally perpendicular to the axis along which strain is to be measured, with the pair of fingers being moveable with respect to the third finger along the axis when the strain occurs. An electrically charged element for producing an electric field is disposed on the working surface of the third finger, and a pair of field-effect transistors (FETS) are each disposed on a working surface of a different one of the pair of fingers. As the object is subjected to strain causing the pair of fingers to move relative to the third finger, the variations in the strength of the electric field from the charged elements to the FETS is determined and this provides a measure of the variation in distance between the third finger and the pair of fingers and this, in turn, provides a measure of the strain in the object to which the substrate is attached.

Field-based movement sensor

Apparatus for non-planar treatment of a workpiece utilizing exposure beam lithography includes a vacuum chamber, an exposure beam generator such as an electron beam generator disposed in the chamber for directing a beam towards a work location, a chuck disposed in the chamber for holding and positioning the workpiece at the work location, a rotary motorized stage disposed in the chamber and responsive to first control signals for selectively rotating the chuck, and thus the workpiece, to thereby expose different areas of the workpiece to the beam, and a linear motorized stage disposed in the chamber on which the rotary stage is mounted, said linear motor being responsive to second control signals for selectively moving the rotary stage and thus the chuck and workpiece in a linear direction which is generally parallel with the axis of rotation of the rotary stage. The workpiece is thus exposed over additional areas by operation of the linear stage. A controller supplies first and second control signals to the rotary stage and linear stage respectively to selectively effect the operation thereof.

Method and apparatus for fabrication of micro-structures using

A field-based movement sensor adapted for measuring strain along a certain axis in an object on which the sensor is attached. The sensor includes a substrate having a working surface and formed with a pair of fingers projecting from a first direction, and a third finger projecting from a direction opposite the first direction, to a position between the pair of fingers. The pair of fingers and third finger extend generally perpendicular to the axis along which strain is to be measured, with the pair of fingers being moveable with respect to the third finger along the axis when the strain occurs. An electrically charged element for producing an electric field is disposed on the working surface of the third finger, and a pair of field-effect transistors (FETS) are each disposed on a working surface of a different one of the pair of fingers. As the object is subjected to strain causing the pair of fingers to move relative to the third finger, the variation in the strength of the electric field from the charged elements to the FETS is determined and this provides a measure of the variation in distance between the third finger and the pair of fingers and this, in turn, provides a measure of the strain in the object to which the substrate is attached.

A transducer for measuring strain in an object on which the transducer is placed includes a flexible, generally planar frame member for placement on the object. The frame member, in turn, includes a pair of generally parallel beams, one of which is moveable with respect to the other when the object is subjected to strain, and a plurality of spaced-apart laterally flexible connecting beams extending between the pair of beams. The transducer also includes a force field emitter disposed on the one moveable beam for producing a force field which diminishes in strength with distance from the force field emitter. A spacer plate is disposed on the other of said parallel beams and a substrate is disposed on the spacer plate so as to be be positioned above, but spaced from the frame member. A detection element is disposed on the underside of the substrate generally above the force field emitter for detecting the presence of the force field and for producing signals representing force field strength and thus the distance of the detecting element from the force field emitter.

Field-based movement sensing apparatus

A field-based movement sensor adapted for measuring strain along a certain axis in an object on which the sensor is attached. The sensor includes a substrate having a working surface and formed with a pair of fingers projecting from a first direction, and a third finger projecting from a direction opposite the first direction, to a position between the pair of fingers. The pair of fingers and third finger extend generally perpendicular to the axis along which strain is to be measured, with the pair of fingers being moveable with respect to the third finger along the axis when the strain occurs. An electrically charged element for producing an electric field is disposed on the working surface of the third finger, and a pair of field-effect transistors (FETS) are each disposed on a working surface of a different one of the pair of fingers. As the object is subjected to strain causing the pair of fingers to move relative to the third finger, the variations in the strength of the electric field from the charged elements to the FETS is determined and this provides a measure of the variation in distance between the third finger and the pair of fingers and this, in turn, provides a measure of the strain in the object to which the substrate is attached.

An eccentric motion motor includes a hollow cylindrical stator in which is positioned a cylindrical armature in rolling engagement with the stator. Elongate conductive strips are disposed in the inside wall of the hollow of the stator to extend substantially the length thereof, with the strips being circumferentially spaced about the stator hollow. The conductive strips are coupled to a commutator voltage source which applies a voltage to successive ones of the conductive strips to produce an electrostatic force which attracts the armature and causes it to roll in the hollow of the stator. The armature may be made either of a conductive material or a dielectric material.

Eccentric motion motor

A system and method for controlling the position and movement of an object in up to six desired degrees of freedom. The system comprises an armature which is provided with a distribution of electric charge. The armature may also include one or more magnetized regions. The system further comprises a base having components that may be actively controlled so as to cause a force to be exerted on the electric charge distribution of the armature. By appropriately controlling the components of the base, the position and movement of the armature with respect to the base can be selectively controlled. The base may also include passive electric and/or magnetic components which assist in stabilizing the armature in one or more degrees of freedom. In addition, the base may be provided with position sensors which provide position information to control circuitry such that the position and movement of the armature with respect to the base can be controlled automatically.

Micropositioner systems and methods

Sensor systems and methods for detecting the position and/or movement of an object in multiple degrees of freedom. The sensor system of the present invention comprises at least one field-effect transistor (FET), the geometrical configuration of the FET being selected so as to provide the desired sensitivity. The FET is preferably provided with a conductive gate adjacent to but insulated from the channel region of the FET. An object whose position and/or movement is to be detected is prepared such that an electric field emanates from the object. The FET is brought into the vicinity of the object, and the electric field emanating from the object interacts with the gate and/or channel region of the FET so as to modify the magnitude of the electrical current flowing through the channel region. The current through the channel region is detected and is used to obtain information about the position and movement of the object relative to the channel region of the FET. By positioning a plurality of substantially coplanar FETs in the vicinity of the object, the position and/or movement of the object in any desired number of degrees of freedom can be detected and monitored.

Growing community of inventors

Salt Lake City, UT, United States of America

John E Wood