Twin City International, Inc.

John E Tiebor

Jerry J Spongr

Boris B Joffe

Byron E Sawyer

James A Holler

Boris N Ivasyuk

William B Stanton

Ralph J Dalfonso

Peter W Raffelsberger

A coating thickness measuring apparatus for step and repeat coating systems, including; a support member; a common support assembly mounted for pivotal movement about and along a vertical axis; a measuring probe carried by the common support assembly and movable with respect thereto along a horizontal axis; a calibrating disc carried by the common support assembly for rotation with respect thereto about a horizontal axis, having an opening for reception therethrough of the probe and having a plurality of angularly spaced calibration standards movable into selective alignment with the probe; actuators for moving the probe along its horizontal axis, for vertically moving the common support assembly and for rotating the calibration disc; stroke limiting means to halt probe movement between its extreme positions; an indexing bar having a plurality of variably spaced openings; an indexing pin for securing the support member into one of the indexing bar openings; and sensing switches developing signals indicative of the positions of various moving components of the apparatus.

Apparatus for measuring coating thickness

A portable device for measuring coating thickness incorporating a radioactive isotope source and a detector. The device is capable of being readily moved from place to place to measure the thickness of thin film coatings applied to various types of substrates, and incorporates spring means for bringing the isotope source holder into intimate contact with the area to be measured and for holding it in that position. The device also includes a locating system whereby a cross-hair or other image is projected onto the surface of the coating the thickness of which is to be measured, at the point where the source holder would contact the coating surface, permitting extremely accurate locating of the device with respect to the area being measured to thereby facilitate the measuring operation and to permit it to be done in an accurate, speedy, and efficient manner.

Portable coating thickness measuring device

A system for the radiation backscatter measurement of coating thicknesses has a stand for supporting a workpiece, and a probe body removably mounted on the stand and carrying a radiation source, a radiation detector and a sighting device, the probe body being vertically adjustable on the stand to selectively vary the height of the workpiece-receiving throat. The probe body is self-supporting independently of the stand on a workpiece or other supporting surface and can be inverted to provide its own workpiece support, being self-supporting when inverted. The source and detector are movable simultaneously as a unit with the sighting device to position first one and then the other in operative alinement with the axis of measurement.

Measuring system for use in the radiation measurement of layer

A method and apparatus using radiation techniques for measuring coating thicknesses on continuously moving strip material as it travels along a predetermined path and without altering that path. A shuttle carrying a measuring probe having a radioactive isotope source and a detection device is provided in the path of the strip for reciprocation along a preselected segment of the path. The shuttle and the probe are releasably engaged with the strip and carried thereby for synchronous movement therewith in the direction of travel of the strip during a measurement cycle, and are disengaged from the strip when no measurement is being made, the movement of the shuttle then being controlled by an independent drive mechanism.

Method and apparatus for measuring coating thicknesses on continuously

A component positioning fixture is provided for use with a beta backscatter measuring platen having an apertured seat. The fixture has a plate with an opening therethrough for the apertured seat, and alinement pins properly position the plate on the platen. At least one component positioning member is carried by the fixture plate, the member being selectively adjustable relative to the fixture opening for proper positioning of the component to be measured on the apertured seat of the platen. The positioning member is releasably secured in adjusted position and can include a stop member engageable by the component, a member shaped to receive and position the component and interchangeable with other members shaped to receive and position other components, and a pair of positioning guide members movable relative to each other and to the fixture opening along an axis which can be arranged normal to the axis of movement of the stop member. The component positioning member can be mounted for movement relative to the opening along a first axis, and in opposite directions laterally of that axis.

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Williamsville, NY, United States of America

John E Tiebor