Candescent Technologies Corporation

Other

Lawrence Livermore National Security, LLC

Metolius Mountain Products, Inc.

Silicon Video, Inc.

Canon Kabushiki Kaisha

John E Field

Christopher J Spindt

Stephanie Jeanne Oberg

James C Dunphy

Theodore S Fahlen

Duane A Haven

Christopher J Curtin

Ronald L Hansen

Lawrence S Pan

David L Morris

David R Morris

Donald R Schropp, Jr

Chungdee Pong

Donald John Elloway

Ronald S Besser

Brian K Spears

Luc Peterson

Scott T Brandon

Kelli Denise Humbird

Matthew S Dayton

Steve Langer

Ryan Charles Nora

Methods, devices and system for asymmetric inertial confinement fusion are disclosed. One method includes a fixing in position a target capsule comprising an inertial confinement fusion fuel, where the target capsule is substantially spherical. The method further includes for applying an oscillatory compression to the target capsule. The oscillatory compression includes compression at a first time in a radial direction orthogonal to a diametric axis of the target capsule, and compression at a second time along the diametric axis to drive the target capsule into driven into an ovoid shape. The oval shaped target can implode upon being further driven at a third time.

Asymmetric capsule for inertial confinement fusion

The present disclosure is directed to a snapshot multiframe imager having an aperture element having at least one aperture, an adjacently positioned random mask, an imaging element and a computer. The random mask has a plurality of micron scale apertures and receives light passing through the aperture element, which represents the spatial information from the scene being imaged, and generates a plurality of image frames encoded in a spatial domain. The imaging element may operate in a drift-scan mode receives the encoded image frames and generates a streaked pattern of electrons representing a plurality of images of the scene at a plurality of different times. The computer analyzes the streaked pattern of electrons and mathematically reconstructs the plurality of images.

System and method for x-ray compatible 2D streak camera for a snapshot multiframe imager

A climbing cam having opposed asymmetrically sized cam members to eliminate the interference that limits the expansion range of climbing aids of the cam type. An optional cam member provides an opposing force to assist in maintaining the placement of the cam in the rock.

Mechanical climbing aid of the cam type

Inspection method and tool for flat panel displays for localizing short-circuit and open-circuit type defects for optional repair involves inducing a localized temperature change in the display and observing any electrical effect on the network formed by the rows and columns. In one embodiment, a laser is used to heat the rows and columns individually and the resulting time-dependent resistance changes or thermoelectric potentials result in electrical signals on the row and column shorting busses. The method can be used to identify crossings of conductors, which contain defects and may be further used to localize the defects within the crossing. Methods for enhancing the sensitivity of the method are also disclosed.

Use of localized temperature change in determining the location and character of defects in flat-panel displays

The intensity at which electrons emitted by a first plate structure ( ) in a flat-panel display strike a second plate structure ( ) for causing it to emit light is controlled so as to reduce image degradation that could otherwise arise from undesired electron-trajectory changes caused by effects such as the presence of a spacer system ( ) between the plate structures. An electron-emissive region ( ) in the first plate structure typically contains multiple laterally separated electron-emissive portions ( and ) for selectively emitting electrons. An electron-focusing system in the first plate structure has corresponding focus openings ( P and P ) through which electrons emitted by the electron-emissive portions respectively pass. Upon being struck by the so-emitted electrons, a light-emissive region ( ) in the second plate structure emits light to produce at least part of a dot of the display's image.

Flat-panel display with intensity control to reduce light-centroid shifting

A spacer ( ) for a flat-panel display is formed with a main spacer portion ( ), typically shaped like a wall, and a face electrode ( ) situated over a face of main spacer portion. The spacer is inserted between two opposing plate structures ( and ) of the display. The face electrode causes electrons moving from one of the plate structures to the other to be deflected in such a manner as to compensate for other electron deflection caused by the presence of the spacer. The face electrode is divided into multiple laterally separated segments ( ) to improve the accuracy of the compensation along the length of the spacer. A masking step is typically utilized in defining the widths of the segments of the face electrode.

Fabrication of flat-panel display having spacer with laterally segmented face electrode

Scattered or/and transmitted light is employed to determine characteristics, including dimensional information, of an object ( ) such as part ( ) of a flat-panel display. The dimensional information includes the average diameter of openings ( ) in the object, the average density of the openings, and the average thickness of a layer ( ) of the object. Light-diffraction patterns are produced to determine characteristics, such as abnormalities ( and ), of crossing lines ( and ) in such an object.

Use of scattered and/or transmitted light in determining characteristics, including dimensional information, of object such as part of flat-panel display

A flat panel display is disclosed which includes a faceplate with a faceplate interior side, and a backplate including a backplate interior side in an opposing relationship to the faceplate interior side. Side walls are positioned between the faceplate and the backplate. The side walls, faceplate and backplate form an enclosed sealed envelope. A plurality of phosphor subpixels are positioned at the faceplate interior side. A plurality of field emitters are positioned at the backplate interior side. The field emitters emit electrons which strike corresponding phosphor subpixels. A plurality of scattering shields surround each phosphor subpixel and define a subpixel volume. The scattering shields reduce the number of scattered electrons exiting from their corresponding subpixel volume. This reduces the number of scattered electrons from charging internal insulating surfaces in the envelope, as well as striking the non-corresponding phosphor subpixels.

Flat panel display with reduced electron scattering effects

Short circuit detection is performed on a plate structure (,) in which a group of first electrical conductors (,) are nominally electrically insulated from, and cross, a group of second electrical conductors (,). In particular, a magnetic current-sensing operation is performed on at least part of the conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors. The current data is then examined to determined whether there appears to be a short circuit defect at any location where one of the first conductors crosses one of the second conductors.

Magnetic detection of short circuit defects in plate structure

A device (,) for sensing current flowing in a generally flat plate structure (,) contains a magnetic head (,) and signal processing circuitry (,). The magnetic head (a) senses changes in current-induced magnetic flux as the head is positioned over the plate structure and (b) provides a head output signal. The signal processing circuitry processes the head output signal to produce a data signal indicative of how much current appears to flow in the plate structure below the head. A driving voltage, which typically varies in a periodic manner to produce a characteristic signature, is applied to a primary conductor in the plate structure. A location sensor, typically formed with a light source (,) and a light sensor (,), detects the position of the magnetic head relative to the plate structure. A gas-cushion mechanism (,) controls the height of the head above the plate structure.

Device and method for magnetically sensing current in plate structure

A probability analysis technique is performed on magnetically obtained current data to detect short circuit defects in a plate structure (10) in which a group of first electrical conductors (32) are nominally electrically insulated from and cross a group of second electrical conductors (48). In particular, a magnetic current-sensing operation is performed on at least part of the conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors. A short circuit defect probability analysis is then applied to the current data in order to select a location where one of the first conductors crosses one of the second conductors as being most probable of having a short circuit defect.

A device (16) for sensing current flowing in a generally flat plate structure (10) contains a magnetic head (18) and signal processing circuitry (20). The magnetic head (a) senses changes in current-induced magnetic flux as the head is positioned over the plate structure and (b) provides a head output signal. The signal processing circuitry processes the head output signal to produce a data signal indicative of how much current appears to flow in the plate structure below the head. A driving voltage, which typically varies in a periodic manner to produce a characteristic signature, is applied to a primary conductor in the plate structure. A location sensor, typically formed with a light source (100) and a light sensor (102), detects the position of the magnetic head relative to the plate structure. A gas-cushion mechanism (80-98) controls the height of the head above the plate structure.

Device for magnetically sensing current in plate structure

An electrode (12 or 30) of an electron-emitting device has a plurality of openings (16 or 60) spaced laterally apart from one another. The openings can be used, as needed, in selectively separating one or more parts of the electrode from the remainder of the electrode during corrective test directed towards repairing any short-circuit defects that may exist between the electrode and other overlying or underlying electrodes. When the electrode with the openings is an emitter electrode (12), each opening (16) normally extends fully across an overlying control electrode (30). When the electrode with the openings is a control electrode (30), each opening (60) normally extends fully across an underlying emitter electrode (12). The short-circuit repair procedure typically entails directing light energy on appropriate portions of the electrode with the openings.

Structure and fabrication of electron-emitting device having electrode

A flat-panel display contains a pair of plate structures (40 and 42) coupled together to form a sealed enclosure. A spacer (44) is situated in the enclosure for resisting external forces exerted on the display. The spacer is formed with a main spacer portion (60), typically shaped like a wall, and a face electrode (66) situated over a face of the main spacer portion. The face electrode causes electrons moving from one of the plate structures to the other to be deflected in such a manner as to compensate for other electron deflection caused by the presence of the spacer. The face electrode is divided into multiple laterally separated segments (66.sub.1 -66.sub.N) to improve the accuracy of the compensation along the length of the spacer. In fabricating the display, a masking step is typically utilized in defining the widths of the segments of the face electrode.

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Dorrington, CA, United States of America

John E Field