International Business Machines Corporation

John D Davis

Paul Alan Bunce

Yuen H Chan

Donald W Plass

Diana M Henderson

Brian James Yavoich

Jigar Vora

Antonio R Pelella

Russell P Hayes

Tobias Werner

Thomas J Knips

Silke Penth

David Edward Schmitt

Kenneth J Reyer

James W Dawson

Allan L Mullgrav, Jr

Edward F Culican

Philip E Pritzlaff, Jr

Patrick James Meaney

Joseph M Mosley

John Farley Ewen

Douglas J Malone

Richard Edward Serton

Martin E Powell

Clarence I Peterson, Jr

Philip F Noto

Scott A Mc Cabe

Embodiments of the present invention are directed to methods, systems, and circuitry for reduced error in power consumption estimation for distinct circuitries. A non-limiting example includes distinct circuitry having an optimized power consumption definition. The distinct circuitry includes a substrate. The distinct circuitry includes an arrangement of interoperable hardware components disposed on the substrate having input pins defined according to a model described by a hardware description language operable to emulate toggle events of the interoperable hardware components defined by the model having a toggle event count based on combinations of the toggle events that correspond to predetermined power quantities. The toggle events define an aggregate toggle power consumption closer to an actual power consumption than an aggregate pin power consumption based on the input pins.

Memory array having power consumption characteristics

A method for testing a circuit includes receiving, by a noise injection circuit, an input signal and generating a noise pulse. Generating the noise pulse includes computing an input resistor pulse, and computing an output resistor pulse. Generating the noise pulse further includes short-circuiting an output resistor substantially simultaneously with opening an input resistor. The method for testing the circuit includes modifying, by the noise injection circuit, the input signal using the noise pulse.

Noise injection circuit

An aspect a bit selection path configured to propagate a bit selection signal. The bit selection path includes bit selection delay circuitry defining a bit selection delay. The memory array includes a row selection path configured to propagate a row selection signal. The row selection path includes row selection delay circuitry defining a row selection delay. The memory array includes local selection circuitry. The local selection circuitry is configured to receive the bit selection signal from the bit selection path before the row selection signal from the row selection path according to the bit selection delay and the row selection delay.

Random-access memory array memory cell selection

According to one or more embodiments of the present invention, a delay circuit includes a first sub-circuit that delays a leading edge of an input signal according to first control settings, the input signal being for an electric device. The delay circuit further includes a second sub-circuit that delays a trailing edge of the input signal according to second control settings. An output signal from the delay circuit is received by the electric device.

Fine-grained programmable delay and pulse shaping circuit

A plurality of dynamic decode circuits for decoding a plurality of input signals comprises a decoder that decodes the plurality of input signals to produce a result at a first node, the result is propagated to a second node while an evaluation clock is active by a pair of serially connected transistors consisting of a transistor receiving an evaluation clock at its gate and a transistor receiving the first node at its gate, the plurality of dynamic decode circuits sharing a conditioned node.

Dynamic decode circuit with active glitch control

A method for decoding a plurality of input signals in a plurality of dynamic decode circuits, each dynamic decode circuit sharing a conditioned node and comprising a decoder that decodes the plurality of input signals to produce a result at a first node, the result is propagated to second node while an evaluation clock is active by a pair of serially connected transistors consisting of a transistor receiving an evaluation clock at its gate and a transistor receiving the first node at its gate.

Dynamic decode circuit with active glitch control method

Modular flywheel holesaw

A method for a dynamic decode circuit to decode a plurality of input signals, the dynamic decode circuit comprises a decoder that decodes the plurality of input signals to produce a result at a first node, the result is propagated to a second node while an evaluation clock is active by a pair of serially connected transistors consisting of a transistor receiving an evaluation clock at its gate and a transistor receiving the first node at its gate, the interconnection of the pair of serially connected transistors is precharged when the evaluation clock is inactive.

A dynamic decode circuit for decoding a plurality of input signals comprises precharge circuits that consist of two serially connected transistors, that utilize an evaluate clock and a delayed evaluate clock, that delay the start of a precharge phase for a predetermined period after the end of an evaluation phase.

Dynamic decode circuit with delayed precharge

A dynamic decode circuit for decoding a plurality of input signals comprises a decoder that decodes the plurality of input signals to produce a result at a first node, the result is propagated to a second node while an evaluation clock is active by a pair of serially connected transistors consisting of a transistor receiving an evaluation clock at its gate and a transistor receiving the first node at its gate, the interconnection of the pair of serially connected transistors is precharged when the evaluation clock is inactive to provide a delay between the end of the active evaluation clock and the beginning of the precharge.

A system for dual mode operation having power saving and active modes in a stacked circuit topology having logic preservation is provided. The system includes a pre-charge circuit and a sleep mode control circuit for providing a signal to disable a plurality of circuit elements and switching a mode of the system, the sleep mode control circuit being coupled to the pre-charge circuit and further being coupled to a logic function circuit, wherein the plurality of circuit elements comprise logic gates and transistor devices. The system also includes a keeper circuit coupled to the global bitline, and the logic function circuit coupled to a solar bitline, wherein the logic function circuit preserves a state of the solar bitline, the state of the global bitline determines the state of the solar bitline. The system includes an effective pull-up transistor coupled to the sleep mode control circuit and the logic function circuit.

Dual mode operation having power saving and active modes in a stacked circuit topology with logic preservation

Embodiments of the disclosure include a cache array having a plurality of cache sets grouped into a plurality of subsets. The cache array also includes a read line configured to receive a read signal for the cache array and a set selection line configured to receive a set selection signal. The set selection signal indicates that the read signal corresponds to one of the plurality subsets of the cache array. The read line and the set selection line are operatively coupled to the plurality of cache sets and based on the set selection signal the subset that corresponds to the set selection signal is switched.

Cache array with reduced power consumption

A memory array can include a global evaluation circuit, a local evaluation circuit for evaluating a voltage level of a local bit line and a wake transistor configured to connect an output of the local evaluation circuit to a global bit line (GBL) of the global evaluation circuit. The global evaluation circuit can include a holding circuit. The wake transistor can be turned on in response to a read signal, and remain on while the GBL is precharged to a logical 'high' voltage. Memory cells connected to the at least one local bit line can be addressed, and the local bit line can be pulled to a logical 'low' voltage for a first time period. The GBL can be pulled to a logical low voltage for a second time period, and the holding circuit polarity can be reversed during a third time period.

Growing community of inventors

Maybrook, NY, United States of America

John D Davis