Xilinx, Inc.

John D Corbett

Neil G Jacobson

Prasanna Sundararajan

David W Bennett

Jason J Moore

Steven E McNeil

Ian L McEwen

Jeffrey M Mason

Reto Stamm

Eric M Shiflet

Dagan M White

Apparatuses, systems, and methods for detecting changes to an IC are disclosed. In an example implementation, an apparatus includes an electromagnetic (EM) sensor. A high-resolution analog-to-digital converter (ADC) is configured to quantize a segment of the EM signal of an IC measured by the EM sensor. The quantized segment of the EM signal is unique to process-voltage-temperature (PVT) characteristics exhibited by the IC. The apparatus also includes a processing circuit configured to prompt the high-resolution ADC, via a control signal, to produce the quantized segment of the EM signal. The processing circuit determines a first signature from the quantized segment and retrieves a baseline signature corresponding to the IC from a data storage circuit. In response to the first signature being different from the baseline signature, the processing circuit indicates that a change to the IC is detected.

Electromagnetic verification of integrated circuits

Methods and circuits for superclocked operation of a plurality of functionally-equivalent logic circuits are disclosed. One of the plurality of functionally-equivalent logic circuits is selected according to a selection algorithm. In response to selecting one of the plurality of functionally-equivalent logic circuits, superclocked operation of the selected one of the plurality of functionally-equivalent logic circuits is enabled. Superclocked operation of other ones of the plurality of functionally-equivalent logic circuits is disabled. The selected one of the plurality of functionally-equivalent logic circuits is used to process a portion of the input data set at the superclocked clock frequency.

Method and circuits for superclocking

In one embodiment, a method of detecting corruption of configuration memory is provided. A bitstream of a circuit design that includes at least a first module and a second module is generated. Configuration memory cells used to implement each of the first and second modules are determined. The configuration memory cells are programmed with the bitstream. After programming, configuration memory cells used to implement the first module are checked for corruption at a first frequency, and configuration memory cells used to implement the second module are checked for corruption at a second frequency, with the first frequency being different from the second frequency.

Prioritized detection of memory corruption

A computer-implemented method of verifying isolation of a plurality of instances of a redundant module of a circuit design that is implemented within a single, programmable integrated circuit can include counting component failures needed to establish a connection between at least two different ones of the plurality of instances of the redundant module. The method can include determining whether each instance of the redundant module is isolated from each other instance of the redundant module according to the counting of component failures, and outputting an indication whether each of the plurality of instances of the redundant module is isolated.

Isolation verification for implementing modular redundancy within programmable integrated circuits

A computer-implemented method of reducing susceptibility of a circuit design to single event upsets can include determining a susceptibility level of the circuit design to single event upsets, comparing the susceptibility level with a target susceptibility, and selectively applying a mitigation technique to at least one of a plurality of regions of the circuit design when the susceptibility level of the circuit design exceeds the target susceptibility. The circuit design including the mitigated region can be output.

Reducing susceptibility of circuit designs to single event upsets

A computer-implemented method of verifying isolation between a plurality of modules of a circuit design to be implemented within an integrated circuit can include identifying a first module and at least a second module of the circuit design for the integrated circuit. One or more circuit attributes indicative of isolation between the first module and the second module can be identified and compared with at least one isolation criterion. An indication of whether the first module is isolated from the second module can be output according to results of the comparison.

Isolation verification within integrated circuits

Approaches for generating a design of an electronic system are disclosed. In one approach, for each of one or more components of a first specification of the design, an error mitigation technique is selected from among multiple different error mitigation techniques in response to user-specified data associated with the first specification of the design. A second specification of the design is automatically generated from the first specification. The second specification includes error mitigation logic corresponding to each selected error mitigation technique for each of the one or more components. The second specification of the design is stored for subsequent processing.

Methods for automatically generating fault mitigation strategies for electronic system designs

A computer-implemented method of verifying electrical isolation of portions of a circuit design for a programmable integrated circuit (IC) can include translating a circuit design into a circuit design bitstream specifying a plurality of regions, wherein the regions are to be isolated from one another. Routing resources of the programmable IC that are not used by the circuit design can be identified. A fence bitstream can be generated that specifies the unused routing resources. The circuit design bitstream can be compared with the fence bitstream. An indication of whether the plurality of regions of the programmable IC are isolated can be output according to the comparison.

Growing community of inventors

Monte Sereno, CA, United States of America

John D Corbett