University of Pennsylvania

University of Surrey

John C Schotland

George Y Panasyuk

Lucia Florescu

Alexander A Govyadinov

Vadim Markel

Apparatus and methods for constructing a tomographic image of a sample are disclosed. The apparatus comprises at least one source configured to emit electromagnetic radiation at a first wavelength, at least one angularly-selective detector configured to detect the electromagnetic radiation at a second wavelength after the electromagnetic radiation has interacted with the sample, and a controller configured to construct a tomographic image of the sample based on information gathered using the at least one detector. The controller obtains information indicative of an intensity of the electromagnetic radiation detected at a second position by the at least one detector while the source is in a first position. Then, the source and detector positions are interchanged, and the controller obtains information indicative of an intensity of the electromagnetic radiation detected at the first position by the at least one detector while the electromagnetic radiation is emitted from the second position. By utilising the non-reciprocity of the broken ray transform, the controller can determine a first coefficient relating to an attenuation of the electromagnetic radiation in the sample at the first wavelength, a second coefficient relating to an attenuation of the electromagnetic radiation in the sample at the second wavelength, and a third coefficient relating to a material property that influences the intensity of the electromagnetic radiation measured by the at least one detector, and construct a tomographic image of the sample based on the determined first, second and third coefficients.

Apparatus and methods for non-reciprocal broken ray tomography

A system and method for optically imaging a sample. The method and system uses a controlled scatterer of light positioned in the near field of a sample. The extinguished power from an incident field, which illuminates both the sample and the controlled scatterer, is then measured as a function of the controlled scatterer position and is used to mathematically reconstruct an image of the sample.

Growing community of inventors

Ann Arbor, MI, United States of America

John C Schotland