Digital Optics Corporation

Tessera North America, Inc.

Digitaloptics Corporation East

John Barnett Hammond

Alan D Kathman

Michael R Feldman

James E Morris

Hongtao Han

Jay Mathews

Alvaro Cruz Cabrera

Robert Te Kolste

Thomas J Suleski

Robert D TeKolste

James E Morris, Jr

Alvaro A Cruz-Cabrera

Bingzhi Su

An optical chassis includes a mount substrate an optoelectronic device on the mount substrate, a spacer substrate, and a sealer substrate. The mount substrate, the spacer substrate and the sealer substrate are vertically stacked and hermetically sealing the optoelectronic device. An external electrical contact for the optoelectronic device is provided outside the sealing. At least part of the optical chassis may be made on a wafer level. A passive optical element may be provided on the sealer substrate or on another substrate stacked and secured thereto.

Wafer based optical chassis and associated methods

A camera including a mount substrate, a detector on a first surface of the mount substrate, a spacer on the mount substrate, the spacer including a hole exposing the detector, a cover on the spacer, the cover covering the hole, the mount substrate, the spacer and the cover together sealing the detector, the cover having a planar surface facing the detector, and an external electrical interconnection for the detector provided outside the sealing, the external electrical interconnection being on a first surface and a second surface, different from the first surface, of the mount substrate, the external electrical interconnection adapted to connect the detector to an electrical contact pad.

Optical chassis, camera having an optical chassis, and associated methods

Optical apparatus

A wavelength locker for use at more than one wavelength includes filters with different characteristics for a corresponding detector. The filters may be etalons having different free spectral ranges, e.g., having different apparent or real thicknesses. If more than three such filters are used outputting offset periodic signals, a reference detector may be eliminated and continuous operation over a wavelength range may be realized.

Wavelength monitor for use with more than one wavelength

A structure having an optical element thereon has a portion of the structure extending beyond a region having the optical element in at least one direction. The structure may include an active optical element, with the different dimensions of the substrates forming the structure allowing access for the electrical interconnections for the active optical elements. Different dicing techniques may be used to realize the uneven structures.

Separating of optical integrated modules and structures formed thereby

Integrated wavelength locker for use with more than one wavelength and associated methods

Passive thermal stabilization of a wavelength monitor includes shielding a wavelength dependent filter of the wavelength monitor from ambient cavity temperatures with portions extending from a submount supporting detectors for the wavelength monitor. The portions and the submount may constitute a single piece, or may be multiple pieces. The shield covers at least one surface of the wavelength dependent filter. The shield may include electrical interconnections for the detectors. A temperature detector may be provided on the submount or the shield portions. The submount or shield portions may be modeled and/or designed to have a section that tracks the thermal response of the wavelength dependent filter and the temperature detector may be mounted on that section.

Passive thermal stabilization of wavelength monitor

Numerous features may be incorporated into a wavelength locker to reduce the noise inherent therein. These features may be used in any combination thereof. These features include avoiding the use of reflectors, using a diffractive splitter which outputs evanescent beams for diffractive orders greater than one, using anti-reflective coatings, using an opaque material with through holes for the light, and designing the wavelength locker to be used at a tilt.

Reduced noise wavelength locker module

An etalon used in analyzing a wavelength of a light source includes ant etalon only in a portion of a substrate in which the etalon is integrated. Use of such an etalon in monitoring or controlling the wavelength allows the etalon to be placed in an application beam. A portion of the application beam is split into at least two beams, a first beam being directed to the etalon to monitor the wavelength, and the other beam either serving purely as a reference beam or passing through another etalon having a different optical path length than the etalon for the first beam, thereby also monitoring the wavelength. The monitor itself would include at least two photodetector, one for each of the beam split off of the input beam. Any or all substrates containing the elements for the monitor may be created on a wafer level and diced and/or bonded to other wafers containing other elements and diced.

Etalon, a wavelength monitor/locker using the etalon and associated methods

An interface system includes separate optical and mechanical interfaces between opto-electronic devices and fibers. This allows each of these components to be optimized for there particular function. This also allows two surfaces to be provided for the optical interface, allowing the opto-electronic elements to be spaced further apart than the fibers. The interface system can be integrated together, used in conjunction with a conventional fiber housing, and can be surface mounted with an electrical interface.

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Charlotte, NC, United States of America

John Barnett Hammond