Qualcomm Incorporated

John Abcarius

Andrew Weil

Debesh Bhatta

Jeffrey Mark Hinrichs

Karthik Nagarajan

Wenjing Yin

Kevin Jia-Nong Wang

Hui Wang

Christian Venerus

Shitong Zhao

Sulin Li

Robert Martin Ondris

Sarthak Kalani

Techniques and apparatus for determining dynamic current mismatches in a current-steering digital-to-analog converter (DAC) are provided. One example technique generally includes accumulating current mismatches between a DAC cell of a plurality of DAC cells and a reference cell using a capacitive element and changing a polarity of the capacitive element during the accumulating. The timing of the accumulating may be controlled such that a static current mismatch between the DAC cell and the reference cell is at least reduced and a dynamic current mismatch between the DAC cell and the reference cell is enhanced.

Dynamic current mismatch accumulation schemes for digital-to-analog converters

Certain aspects of the present disclosure provide a relatively compact frequency-locked loop (FLL) using a discrete-time integrator. For certain aspects, the FLL also includes a supplemental oscillator and other circuitry that allows for saving the FLL frequency when a reference clock will be disconnected, maintaining a similar frequency during disconnection, and restoring the FLL frequency when the reference clock is reconnected. One example FLL circuit generally includes: an encoder; a combiner comprising a first input coupled to an output of the encoder; a digital-to-analog converter (DAC) comprising an input coupled to an output of the combiner; a discrete-time integrator comprising an input coupled to an output of the DAC; a voltage-controlled oscillator (VCO) comprising a control input coupled to an output of the discrete-time integrator; and a counter comprising an input coupled to an output of the VCO and comprising an output coupled to a second input of the combiner.

Compact frequency-locked loop architecture for digital clocking

An aspect of the disclosure relates to a reference voltage generator, including: a first field effect transistor (FET) including a first threshold voltage; a second FET including a second threshold voltage different than the first threshold voltage; a gate voltage generator coupled to gates of the first and second FETs; a first current source coupled in series with the first FET between first and second voltage rails; a second current source; and a first resistor coupled in series with the second current source and the second FET between the first and second voltage rails, wherein a reference voltage is generated across the first resistor.

Reference voltage generator based on threshold voltage difference of field effect transistors

Certain aspects of the present disclosure provide apparatus and techniques for digital-to-analog conversion. One example apparatus generally includes a first digital-to-analog converter (DAC) having an input coupled to a digital input node of the apparatus, a second DAC, a digital processor coupled between the digital input node and an input of the second DAC, and a combiner coupled to the first DAC and the second DAC.

Partitioned digital-to-analog converter system

A phase locked loop (PLL) includes a first charge pump coupled to a filter. The first charge pump may feed the filter a first current. A second charge pump is coupled to the filter. The second charge pump may feed the filter a second current. A first gate is coupled to an input of the second charge pump. The first gate selectively gates the second current.

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San Diego, CA, United States of America

John Abcarius