1. J.a. Woollam Co. (55 from 211 patents)

2. University of Nebraska (13 from 935 patents)

3. J.a. Woollan Co., Inc. (1 from 2 patents)

4. J.a. Wooliam Co., Inc. (1 from 2 patents)

5. James D. Welch (1 from 1 patent)

1. 11675208 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system

2. 10101265 - Birefringence imaging chromatography based on highly ordered 3D nanostructures

3. 10073120 - Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use

4. 10048059 - Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited at or etched from a working electrode that preferrably comprises non-normal oriented nanofibers

5. 10026167 - Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast

6. 9851294 - Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use

7. 9041927 - Terahertz-infrared ellipsometer system, and method of use

8. 8934096 - Terahertz-infrared ellipsometer system, and method of use

9. 8705032 - Terahertz-infrared ellipsometer system, and method of use

10. 8488119 - Terahertz-infrared ellipsometer system, and method of use

11. 8416408 - Terahertz-infrared ellipsometer system, and method of use

12. 8169611 - Terahertz-infrared ellipsometer system, and method of use

13. 8159672 - Sample investigating system and method of use

14. 7768660 - Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample

15. 7746472 - Automated ellipsometer and the like systems