Western Digital Technologies, Inc.

John A Strange

John A Morrison

Michael S Allison

Stephen J Silva

Nathan Jared Hughes

Systems and methods for testing non-volatile storage devices are disclosed that provide functionality to control when testing of the non-volatile storage device is performed. In one embodiment, information stored in persistent memory indicates whether testing is enabled or disabled. For example, the testing information may indicate that testing is to be performed upon a first initialization of a non-volatile storage device, but not in connection with subsequent power-up events. Furthermore, functionality is disclosed for re-running and/or bypassing testing of the non-volatile storage device.

Automatic and on-demand testing of non-volatile storage devices

A solid-state storage system is described with a method for adjusting the frequency of data retention operations. The data retention operation frequency can be increased or decreased according to a variety of environmental factors such as error code frequency, system temperature, altitude, and other operating conditions. These factors can indicate an increased or decreased risk of failure and accordingly provide increased or decreased rates of data retention operations.

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Fort Collins, CO, United States of America

John A Strange