Measurex Corporation

Honeywell-measurex Corporation

Honeywell International Inc.

John A Dahlquist

Edward Belotserkovsky

John D Goss

John J Howarth

Gunnar Wennerberg

Allen Frohardt

Joseph F Binkowski

Alan R George

A comparison of the specular and diffused radiation reflected from a coating can be used in ratio to locate the gel point of the coating, and to monitor coating drying characteristics. This same system may be used to monitor the drying process of the coatings in a lab setting to characterize the drying process, optimize coating quality or optimize mill efficiency. A system implementing the Applicant's method uses a radiation source to illuminate a measurement location on the coating, and then provides a first and second radiation detectors to detect reflected radiation from the coating, originating from the radiation source. One of the radiation detectors is arranged to collect specular radiation. The second detector is arranged to collect only diffused radiation. The ratio of these two values represents information about the location of the gel point for the coating, and coating drying characteristics.

Gel point sensor

A sensor and a method for determining the basis weight of a coating material containing CaCO.sub.3 on a substrate is described. The determined basis weight is insensitive to changes in the amount of substrate material underlying the coating. Signals from the sensor may be used in the control of a coating mechanism to provide a coating having a uniform basis weight.

Coating weight measuring and control apparatus and method

Coating weight measuring and control apparatus

A non-contact thickness measuring sensor is disclosed which determines the thickness of an overlying material on a substrate. The sensor includes two non-contact separation distance measuring devices which may be utilized to measure the distance from the first device to a portion of the interface between the substrate and the overlying material, while the second device determines the distance from the second device to a portion of the surface of the overlying layer. The difference in the measured distances is related to the thickness of the overlying material. In one embodiment, two lasers are used to measure the separation distances. In another embodiment, the two measured distances are coincident. Because of the coincident geometry of these two measurements, the thickness measuring sensor of this embodiment is substantially insensitive to misalignment of the sensor from the normal to the surface of the overlying layer being measured.

Non-contact sensor and method using inductance and laser distance

An on-line scanning sensor system includes a mid-infrared spectrophotometric analyzer, such as an interferometer, that can be used on-line in manufacturing environments. More particularly, the on-line scanning sensor system includes a first carriage for scanning motion across a traveling sheet of material; interferometer components that are carried by the first carriage and that includes devices for splitting and recombining infrared light, and for directing a collimated beam of the recombined light onto a traveling web of sheet material. Further, the system includes a detector system for receiving light from the interferometer components during scanning.

Scanning interferometer sensor system

An on-line scanning sensor system includes first and second horizontally extending guide members connected by side members to define a rigid box-like frame, and a support structure for suspending the box-like frame via vibration-absorbing devices such that vibrations are substantially attenuated before reaching the guide members. Further, the system includes a carriage mounted on the first guide member for scanning motion across a traveling web of sheet of material, and interferometer components mounted to the carriage for splitting and recombining infrared light and for directing a collimated beam of the recombined light onto the traveling sheet. Still further, the system includes a detector for receiving light from the interferometer components during scanning.

Scanning sensor system including an FT-IR interferometer

A scanning system and method for optically measuring parameters such as dry basis weight, basis weight and moisture content of fibrous sheets during manufacture. The system includes a first track that extends generally parallel to one face of a traveling web in the cross direction; a stationary light source arranged to direct collimated light generally parallel to the first track; a first reflector that travels along the first track and focuses the collimated light against the adjacent face of the web; a second track that extends parallel to the first track adjacent the opposite face of the web; a second reflector that travels along the second track and collects and collimates rays that are transmitted through the web; and stationary light detectors that detect the intensity of the collected rays at least at two selected ranges of wavelengths to measure the absorption properties of the traveling web at selected locations.

Rapid-scanning infrared sensor

A device for determining gloss on a surface having a calibrating feature wherein a gloss calibration standard is provided by means of a built-in standardization surface. The standardization surface provides a reference to which the gloss of a sample surface is compared. The standardization surface is protected from dust build-up throughout the operation of the device.

Gloss gauge

The present invention is a device to measure the degree of cure of fiberglass using only infrared radiation. Particular frequencies of infrared radiation are used to determine the value of a cure-sensitive function and also the value of as cure-insensitive function and from a combination of the values of the functions, a property of fiberglass is determined.

System and process for measuring fiberglass

A system for measuring the values of a parameter of a sheet of material is provided. The system includes a head system with sensors mounted therein and a distance correction system to correct the measured parameter for variations in the distance between parts of the head system.

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Palo Alto, CA, United States of America

John A Dahlquist