Rohde and Schwarz Gmbh & Co. Kg

Johannes Steffens

Florian Ramian

Hermann Boss

Stefan Aman

Luke Cirillo

Corbett Rowell

Markus Freidhof

Kurt Schmidt

Meik Kottkamp

Werner Held

Gregor Feldhaus

Hagen Eckert

Steffen Heuel

Andreas Pauly

Michael Simon

Florian Lang

Josef Koeppl

Jens Franke

Bjoern Coenen

Manfred Mueller

Torsten Schorr

Martin Kappels

Volker Fischer

Markus Niedl

Andre Schoch

Ronald Tonn

Matthias Roth

Stefan Dannerbauer

Manfred MÜLLER

The present disclosure relates to a measurement system for testing an object, including an anechoic chamber assembly with a first chamber portion and a second chamber portion. An intermediate shared wall is located between the chamber portions that encompass a first space and a second space. The intermediate shared wall has a first surface orientated towards the first space and a second surface orientated towards the second space. The intermediate shared wall has an opening that provides a passage between the spaces. The surfaces include absorber material. Inner walls of the chamber portions comprise absorber material. The opening in the intermediate shared wall defines a mounting portion for the object. Further, a method of testing an object by using the measurement system is described.

Measurement system and method for testing an object

A rack for receiving electronic devices has a plurality of receiving slots. At least one of the receiving slots has a scissor mechanism, the scissor mechanism having a first end connected to the rack and a second end provided with a mounting interface. The mounting interface is adapted for being mechanically connected to an electronic device.

Rack for receiving electronic devices, in particular measuring devices or servers

A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received. In the case of generating the digital instruction signal by the signal source, the device under test includes circuitry configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element is configured to forward the analog output signal generated to the analysis module. The analysis module includes circuitry configured to determine at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test. Moreover, a measurement method for characterizing a device under test is described.

Measurement system and measurement method

The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.

Probe, measuring system and method for applying a probe

A housing wall includes at least one air grid having at least a first layer with a first mesh structure and a second layer with a second mesh structure. The first mesh structure is coextensively arranged with the second mesh structure. The first layer and the second layer are electrically conductively coupled. The first mesh structure includes a first plurality of through-holes. The second mesh structure includes a second plurality of through-holes. The through-holes of the first plurality of through-holes are misaligned compared to through-holes of the second plurality of through-holes such that a nonuniform total through-hole configuration of the air grid is provided.

Nonuniform air grid

A multiuser measurement system is provided. The multiuser measurement system may authenticate a specific user. When the user has been authenticated, user related data may be obtained from a memory. The user related data are stored in the memory in an encrypted manner, and the encrypted data are only decrypted after authenticating the user.

Multiuser measurement system and method for operating a multiuser measurement system

A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Test system

An electrical device including a skeleton-like frame structure and at least one electrical module is provided. The skeleton-like frame structure has a low rigidity, while the at least one electrical module provides an increased rigidity when mounted.

Electrical device with a modular structure

A measuring method for locating an imperfection in an electrically conductive material comprises applying an electric input signal with an electric signal generator to the electrically conductive material such that the electrically conductive material acts as an antenna and thereby transmits an electromagnetic output signal having a frequency spectrum comprising a contributing frequency corresponding to the imperfection within the electrically conductive material; receiving the electromagnetic output signal with an antenna detection system, wherein the antenna detection system probes the frequency spectrum of the electromagnetic output signal as a function of at least one of position and direction; and locating the imperfection within the electrically conductive material by analyzing with an analysis device a spatial origin of the contributing frequency within the frequency spectrum of the received electromagnetic output signal.

Measuring method and measuring arrangement

A measurement system for real-time visualization of radiation pattern is provided. The measurement system comprises an antenna array with a plurality of antennas configured to provide a voltage gain corresponding to a received radio signal. Furthermore, the measurement system comprises a plurality of radio frequency detectors configured to rectify the voltage gain from each antenna of the plurality of antennas. In addition, the measurement system comprises a plurality of amplifiers downstream of the plurality of radio frequency detectors configured to amplify the magnitude of a rectified voltage from each of the radio frequency detectors. The measurement system moreover comprises a plurality of receiving elements, each includes a light emitting diode and configured to receive an amplified voltage corresponding to each amplifier of the plurality of amplifiers.

System and method for real-time visualization of radiation pattern

A testing device for testing a device under test emitting a number of beams with respect to its beamforming behavior. Said testing device comprises an antenna, an analyzing unit, and a number of reflectors. Furthermore, each of the number of reflectors is configured to reflect at least one of the number of beams of the device under test to the antenna of the testing device.

Testing device and method for testing a device under test with respect to its beamforming behavior

A measuring system for measuring a communications device comprising an antenna-array. The measuring system comprises a controller, a measuring device, a measuring antenna and a device mount. The measuring device performs measurements with regard to the communications device. The device mount rotates the communications device about at least one axis. The controller sets a maximum gain direction of the antenna-array. The controller (i) controls the device mount to rotate the communications device, compensating for the set maximum gain direction, until the set maximum gain direction meets a direction of the measuring antenna with respect to the communications device, and (ii) determines an actual maximum gain direction of the antenna-array by iteratively rotating the communications device and determining a respective gain for each iteration, and determines the actual maximum gain direction as a rotation of the device mount that corresponds to the iteration of maximal gain.

Wireless measuring system and method for measurement of a device under test with an antenna-array, considering maximum gain direction of the antenna array

The invention relates to a method and to a switching device () and a measurement system (). In the method according to the invention for determining time differences between measurement signals measured by at least two couple measurement devices (), a time basis signal is first generated for the measurement devices (). A common reference signal is further generated by a signal generator (). The common reference signal is fed to measurement signal inputs () of the coupled measuring devices () via the switching device (). A measurement signal is then fed to said measurement signal inputs () of the coupled measuring devices () and the time position of the measurement signals relative to the reference signal is determined in each of the coupled measuring devices (). The switching device (), to this end, has a first measuring device connection () and a second measuring device connection () connected to the measurement signal inputs () of the first measuring device () and the second measuring device (). A reference signal is alternately fed via the measuring device connections () of the switching device () to the first or the second measuring device () by connecting the first measuring device connection () to the reference signal input () or a first measuring connection (), or by connecting the second measuring device connection () to the reference signal input () or the second measuring connection ().

Method for determining time differences between signals measured by at least two coupled measuring devices and measurement system and corresponding switching device

A measuring device for measuring a signal with a first component signal and at least one second component signal comprises a high-frequency processing device, which is embodied to mix the signal in order to form an intermediate-frequency signal and to digitize the latter in order to form a digital composite signal. The measuring device further comprises a digital mixer, which is embodied to generate a first digital composite test signal and a second digital composite test signal subject to a displacement of the frequency of the digital composite signal. Moreover, the measuring device comprises a digital filter, which is embodied to filter the first digital composite test signal in order to form a first digital test signal and to filter the second digital composite test signal in order to form a second digital test signal.

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Rosenheim, Germany

Johannes Steffens