Alcatel N.v.

Johannes Anthonius Van Tetering

Daniel Frans Van De Pol

Erik Moerman

Johan David

Frank Lodewijk Denissen

To test the processing of a data frame processing unit (FPU) which, in a normal working mode, processes input data frames applied to a data frame input (FI) thereof, the data frame processing unit (FPU) is brought in a test mode. Therefore, an active test signal is applied to a test mode control input (TCI) of this data frame processing unit (FPU). When brought in the test mode, the frame counters of the data frame processing unit (FPU) have lower limits and test data frames with smaller dimensions than the input data frames applied to the data frame input (FI).

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Zevenbergen, Netherlands

Johannes Anthonius Van Tetering