Carl Zeiss Microimaging Gmbh

Carl Zeiss Jena Gmbh

Carl Zeiss Microscopy Gmbh

Joerg Steinert

Ralf Wolleschensky

Stefan Wilhelm

Joerg Engel

Joerg-Michael Funk

Michael Goelles

Wolfgang Bathe

Kristina Uhlendorf

Ralf Engelmann

Ulrich Meisel

Bernhard Zimmermann

Hans-Juergen Dobschal

Ralf Netz

Matthias Wald

Ingo Fahlbusch

Werner Kleinschmidt

Dieter Huhse

Saskia Pergande

Michael Brehm

Robert Hauschild

Oliver Holub

Gunther Lorenz

Matthias Danckwerts

As a result of the size of the detector elements thereof, optoelectronic detectors such as photoelectron multipliers comprising a light-entry region sealed by a protective disc can only be used with much outlay for recording an image of a diffraction-limited focus volume in a two-dimensional spatially resolved manner, even if the image is significantly magnified in relation to the focus volume. The novel detector is intended to enable the spatially resolved detection of point spread functions with little outlay and high accuracy. 2.2 For this purpose, a body made of glass or glass ceramics comprising an opening, in which one end of an optical fiber is arranged, is cemented to the cover disc in such a way that the end of the optical fiber faces the cover disc and the optical axis thereof intersects the light-entry region. Thus, the relative position of optical fiber and entry region can be provided permanently with high accuracy. Preferably, the detector includes a plurality of detection channels, in particular 32 channels, comprising a respective light-entry region and the body includes a plurality of openings comprising a respective optical fiber. 2.3 Fluorescent microscopy.

Optoelectronic detector, in particular for high-resolution light scanning microscopy

A laser scanning microscope has an illumination beam path and a detection beam path. A beamsplitter is provided which reflects the illumination light in direction of the sample and transmits the detection light in direction of the detection arrangement. An additional beamsplitter is provided for reflecting the illumination light and for transmitting the detection light, this additional beamsplitter being arranged in the illumination beam path downstream of the first beamsplitter in the illumination direction, and this additional beamsplitter substantially transmits the illumination light reflected at the first beamsplitter and the detection light, but acquires a wavelength range substantially different from the first beamsplitter with respect to its reflectivity.

Laser scanning microscope

A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

Calibration device and laser scanning microscope with such a calibration device

In a method for correcting a control of an optical scanner () which has a beam deflecting element () for deflecting a beam of optical radiation and a drive unit () for moving the beam deflecting element (), said drive unit deflecting a beam of optical radiation directed at the beam deflecting element () according to a predetermined target movement using at least one parameter and/or a transfer function, preferably optical, said parameter or transfer function being used to control or regulate the system. In a determination step at least one current value of a drive unit transfer function that reproduces the response of the drive unit () to a predetermined target movement or a change in a target movement is ascertained for at least one frequency, and in a correction step at least one parameter and/or the transfer function is corrected as a function of the current value of the drive unit transfer function.

Method for correcting a control of an optical scanner and the optical scanner

For a confocal scanning microscope () an optical zoom system () with linear scanning is provided, which not only makes a zoom function possible, in that a variable magnification of an image is possible, but rather which additionally produces a pupil image in the illuminating beam path (IB) [BS] and thereby makes a variable image length possible (distance between the original pupil (En.P) [EP] and the imaged/reproduced pupil (Ex.P) [AP]) so that axially varying objective pupil positions can thereby be compensated.

Optical zoom system for a light scanning microscope

A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order 1 light bundle with first recycle and a reflected diffraction order 0 light bundle with first recycle whereby the diffraction order 1 without recycle and the reflected diffraction order 1 light bundle with first recycle each of a part wavelength range are impressed through the optics on a single element of the detector line.

Spectral analysis unit with a diffraction grating

Method for scanner control in at least one scan axis in a laser scanning microscope, the scan field being divided into partial area, a first image of at least one partial area produced by a forward scan being compared with a second image of the partial area produced by a back scan and a correction value for the scanner control determined from the deviation between the first and second image.

Method for scanner control in at least one scan axis in a laser scanning microscope

A correction device for an imaging optical arrangement exhibiting a light path (), in particular for a microscope, that exhibits at least one plane-parallel transparent plate (), which is held in a mounting plate in the image beam path () and is propelable around at least one axle in a tipping and/or a swiveling motion, in order in adjust a definite parallel misalignment of the beams in the image beam path () by a change in the tipping situation of the plate (). A confocal microscope with such a correction device exhibits a confocal screen (), which illustrates a specimen mark (), whereby the plane-parallel plate () is placed in front of the detector unit () in the light path (), in order to center the illustration of the aperture diaphragm on the detector unit.

Correction device for an optical arrangement and confocal microscope with such a device

Method for correcting control of an optical scanner in a laser scanning microscope for imaging of a sample by scanning, the microscope guiding at least one beam path section of an illumination beam path of the microscope over the sample from an illumination device to the sample and/or an imaging beam path of the microscope from the sample to an acquisition device of the microscope in order to obtain an image of the sample, generating control signals corresponding to a predefined target movement using parameters and/or a transfer function of the scanner that are used for control and/or regulation and moving the at least one beam path section in response to the control signals, whereby an image of a reference sample having predefined structures imageable by the microscope is obtained by generating control signals corresponding to a predefined target test movement and moving the at least one beam path section in response to the control signals, thereby obtaining the image. From the image thereby obtained, a deviation in the actual positions of the predefined structures of the reference sample from the predefined target positions is determined and the transfer function or parameters are corrected as a function of the deviations at least one of the parameters used for control and/or regulation, so that when using the corrected parameter for control or regulation and/or when using the corrected transfer function, the deviation in the actual position of at least one of the structures from the target position of the structure is reduced.

Method for correcting a control of an optical scanner in a device for imaging a sample by scanning and the device for performing the method

Process for observing at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector. At an angle to the plane of the relative movement, a second scanner is moved and an image acquisition takes place by coupling the movement of the first and second scanners and a three-dimensional sampling movement being done by the illumination of the sample. The second scanner is coupled to the movement of the first scanner such that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Process for the observation of at least one sample region with a light raster microscope with linear sampling

In a confocal laser scanning microscope with an illuminating configuration (), which provides an illuminating beam for illuminating a specimen region (), with a scanning configuration (), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (), which via the scanning configuration () images the illuminated specimen region () by means of a confocal aperture () on to at least one detector unit (), it is provided that the illuminating configuration () of the scanning configuration () provides a line-shaped illuminating beam, that the scanning configuration () guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture () or as a slit-shaped region () of the detector unit () acting as a confocal aperture.

Light scanning microscope and use

Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.

For a confocal scanning electron microscope () an optical zoom system () with linear scanning is provided, which not only makes a zoom function possible, in that a variable magnification of an image is possible, but rather which additionally produces a pupil image in the illuminating beam path (IB) [BS] and thereby makes a variable imaging length possible (distance between the original pupil (En.P) [EP] and the imaged/reproduced pupil (Ex.P) [AP]) so that axially varying objective pupil positions can thereby be compensated.

Optical zoom system for a light scanning electron microscope

Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Process for the observation of at least one sample region with a light raster microscope

For a confocal scanning electron microscope () an optical zoom system () is provided, which not only makes a zoom function possible, in that a variable magnification of an image is possible, but rather which additionally produces a pupil image in the illuminating beam path (IB) [BS] and thereby makes a variable imaging length possible (distance between the original pupil (En.P) [EP] and the imaged/reproduced pupil (Ex.P) [AP]) so that axially varying objective pupil positions can thereby be compensated.

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Jena, Germany

Joerg Steinert