Carl Zeiss Microimaging Gmbh

Carl Zeiss Microscopy Gmbh

Carl Zeiss Jena Gmbh

Joerg-Michael Funk

Joerg Steinert

Stefan Wilhelm

Joerg Engel

Ralf Engelmann

Ulrich Meisel

Bernhard Zimmermann

Ralf Netz

Michael Goelles

Ralf Wolleschensky

Frank Hecht

Marcus Heidkamp

Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined.

Laser scanning microscope and its operating method

A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.

Beam combiner employing a wedge-shaped cross-section

Process for observing at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector. At an angle to the plane of the relative movement, a second scanner is moved and an image acquisition takes place by coupling the movement of the first and second scanners and a three-dimensional sampling movement being done by the illumination of the sample. The second scanner is coupled to the movement of the first scanner such that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Process for the observation of at least one sample region with a light raster microscope with linear sampling

In a confocal laser scanning microscope with an illuminating configuration (), which provides an illuminating beam for illuminating a specimen region (), with a scanning configuration (), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (), which via the scanning configuration () images the illuminated specimen region () by means of a confocal aperture () on to at least one detector unit (), it is provided that the illuminating configuration () of the scanning configuration () provides a line-shaped illuminating beam, that the scanning configuration () guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture () or as a slit-shaped region () of the detector unit () acting as a confocal aperture.

Light scanning microscope and use

Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Process for the observation of at least one sample region with a light raster microscope

Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

Growing community of inventors

Jena, Germany

Joerg-Michael Funk