Abb Schweiz Ag

Abb Patent Gmbh

Joerg Gebhardt

Stephan Wildermuth

Paul Szasz

Ralf Gitzel

Joerg Ostrowski

Wilhelm Daake

Patrik Reto Kaufmann

Guruprasad Sosale

Andreas Decker

Peter Ude

Kai Koenig

Juergen Horstkotte

Frank Kassubek

Steffen Keller

Subhashish Dasgupta

Lothar Deppe

Maciej Mruczek

Rene Friedrichs

Patric Ackermann

Karsten Schroeder

Anastasios Papageorgiou

Boguslaw Samul

Tomas Kozel

Kai Hencken

Marcel Dix

Stefan Tabelander

Sebastian Breisch

Aydin Boyaci

Ido Amihai

Oliver Becker

Matthias Berning

Vadim Migunov

Thomas Stahl

Fabio Corbelli

Rolf Disselnkoetter

Ulf Ahrend

Thilo Merlin

Ilario Prina

Paolo Giovio

Guenter Petri

Horst Schwanzer

A system and method for monitoring a device includes a temperature sensor, a processing unit, and an output unit. The temperature sensor acquires a temperature measurement during a heat-up phase of a component and provides a temperature measurement to the processing unit, which selects a simulated transient temperature distribution of the simulated component of the simulated device from a plurality of simulated transient temperature distributions of the simulated component of the simulated device. The selection comprises a comparison of the at least one temperature measurement with the plurality of simulated transient temperature distributions at an equivalent time point in the simulated heat-up to a time point at which the temperature measurement was acquired. When a hot spot is developing an output unit outputs an indication of a fault associated with the component.

System for monitoring a device

A medium voltage switchgear or controlgear monitoring system includes: an infrared camera; and a processing unit. The infrared camera is mounted within a medium voltage switchgear or controlgear. The infrared camera is configured to acquires an infrared image including image data of two or three current carrying parts of the switchgear or control gear. The two or three current carrying parts are the same current carry part of two or three equivalent systems within the switchgear or controlgear. The infrared camera provides the infrared image to the processing unit. The processing unit determines that the two or three current carrying parts are operating correctly or that one of the two or three current carrying parts has a fault. The determination includes analysis of the infrared image by an autoencoder implemented by the processing unit.

Medium voltage switching or controlgear monitoring system

A system for monitoring a switchgear includes multiple infrared cameras with fields of view; a processing unit; and an output unit. The cameras acquire multiple image data of a plurality of phases of the switchgear, and the processing unit determines whether there is a phase imbalance in a specific phase comprising a determination from a plurality of image data that temperature information for a plurality of component parts and/or a plurality of connections for that specific phase has an overall enhanced temperature compared to the temperature information for the same plurality of component parts and/or the same plurality of connections for one or more other phases of the plurality of phases. The output unit is configured to output information that a fault or load imbalance has occurred in a phase.

System for monitoring a switchgear

A temperature sensor assembly configured to be coupled thermally to a vessel wall for determining a temperature of a surface of the vessel wall is provided, the assembly includes: a first single-branched thermal conduction path, between the surface of the vessel wall and an environment of the temperature sensor assembly, comprising a temperature measurement sensor, configured to be thermally coupled to a first site of the surface of the vessel wall resulting in a first thermal resistance; and a second single-branched thermal conduction path, between a second site of the surface of the vessel wall and an environment of the temperature sensor assembly, comprising a reference temperature sensor, configured to be thermally coupled to the surface of the vessel wall resulting in a second thermal resistance.

Temperature sensor assembly

A temperature-measuring device for determining the temperature of a surface or a medium by utilizing the temperature of the surface enclosing the medium includes at least one measuring sensor and at least one reference sensor as well as a value processing device, which is connected to the measuring sensor via a first connection line and which is connected to the reference sensor via a second connection line, wherein of both connection lines at least the first connection line is partly realized as a mineral-insulated sheathed cable providing the measuring sensor, wherein both connection lines comprise a flexible cable connected to the value processing means.

Temperature-measuring device

A system for determining at least one calculated process parameter of a fluid in a pipe includes a data interface receiving nominal process parameters, which relate to nominal parameters of a process that relates to the fluid in the pipe; an invasive temperature sensor that determines a fluid temperature; a reference temperature sensor disposed outside of the pipe for determining a reference temperature; a surface temperature sensor disposed at a surface of the pipe for determining a surface temperature; a process model that determines a process parameter by using the reference temperature, the surface temperature, the received nominal process parameters, and the determined fluid temperature.

System and method for determining at least one calculated process parameter of a fluid in a pipe

A system for monitoring a switchgear includes: an infrared camera for acquiring at least one infrared image of the switchgear; a processing unit for determining a pixel in the at least one infrared image associated with a hottest temperature, determining e pixels in the at least one infrared image associated with a temperature that is within a threshold temperature of the hottest temperature, and determining that a hot spot exists in the switchgear as a determination, the determination being a utilization of the determined pixels in the at least one infrared image; and an output unit for outputting an indication of a fault in the switchgear based on the determined hot spot.

A measurement system for determining a physical parameter of a pipe-fluid system includes a pair of confining elements configured to decrease surface vibration deformations at an outer surface of each end of the pipe-fluid system; wherein each confining element comprise a supporting frame configured to be detachably mounted on a pipe of the pipe-fluid system; and a fixation element configured to be detachably mounted for mechanically coupling the supporting frame with an outer surface of the pipe; an excitation system, configured to generate a mechanical vibration spectrum at a surface of the pipe-fluid system; and a vibration measurement device configured to be mechanically coupled to an outer surface of the pipe-fluid system, and configured to provide a mechanical vibration spectrum of the pipe-fluid system.

Measurement system for determining a physical parameter of a pipe-fluid system

A system and method includes an infrared camera; a processing unit; and an output unit. The infrared camera is configured to acquire a plurality of infrared images of the device, wherein the plurality of infrared images comprises a first infrared image and a second infrared image acquired a time period after the first infrared image. The processing unit is configured to determine a pixel in the first infrared image with a hottest temperature and determine a pixel in the second infrared image with a hottest temperature. The processing unit is configured to determine a first number of pixels in the first infrared image that have a temperature within a threshold temperature of the hottest temperature of the first infrared image and determine a second number of pixels in the second infrared image that have a temperature within the threshold temperature of the hottest temperature of the second infrared image.

A fault detection system and method includes a sensor; a processing unit; and an output unit. The sensor is configured to acquire temperature data at a sensor location of a device, wherein the temperature data comprises first temperature data and second temperature data acquired a first time period after the first temperature data. The processing unit determines a temperature magnitude comprising utilization of the first temperature data and/or the second temperature data, and determines a rate of change of temperature. The processing unit predicts a temperature at a location of the device using the temperature magnitude, the rate of change of temperature, and a correlation, wherein the correlation is a correlation of a plurality of temperature magnitudes and a plurality of rate of change of temperatures at the sensor location with a plurality of hotspot temperatures at the location.

Fault detection system

A method for determining a temperature of a fluid flowing through a pipe section includes: determining a temperature of the pipe section; obtaining a reference temperature at a distance from a surface of the pipe section; determining a heat transfer behaviour, in particular a thermal resistance, of a boundary layer of the fluid on an inner wall of the pipe section based on at least one material property and/or at least one value of a state variable of the fluid; and determining the temperature of the fluid based on the heat transfer behaviour of the boundary layer, a heat transfer behavior, in particular a thermal resistance, of the pipe section, the temperature of the pipe section, and the reference temperature.

Method for non-intrusively determining the temperature of a fluid flowing through a conduit portion

A temperature measuring device for determining a temperature of a medium via a temperature of a measuring point on a surface surrounding the medium includes: at least one measuring sensor; at least one reference sensor; and a measurement value processing means, which is connected via a first supply line to the at least one measuring sensor and via a second supply line to the at least one reference sensor. The first and second supply lines each are mineral-insulated sheathed lines with an outer sheath of metal, the outer sheath enclosing at least two inner conductors which are insulated from the outer sheath with highly compressed metal oxide powder. The at least one measuring sensor is connected to the at least two inner conductors of the first supply line and the at least one reference sensor is connected to the at least two inner conductors of the second supply line.

Temperature measuring device and method for determining temperature

A low or medium voltage switchgear monitoring system includes: at least one sensor; a processing unit; and an output unit. The at least one sensor acquires sensor data within a compartment of a switchgear. The sensor data includes first sensor data. The sensor data includes second sensor data. The second sensor data is acquired a set time after the first sensor data. The at least one sensor provides the first sensor data and the second sensor data to the processing unit. The processing unit determines status information for a compartment of the switchgear based on a comparison of the second sensor data to the first sensor data. The output unit outputs the status information.

Low or medium switchgear monitoring system

A method for testing a temperature measuring instrument is presented, where the instrument includes at least one sensor that changes its electrical resistance, and/or an electrical voltage that it produces, in response to being exposed to a change in temperature, and where the instrument is configured to be coupled to an object of interest. The method includes changing the temperature of at least one sensor by an amount that is detectable given the measurement resolution of the at least one sensor, by driving an electrical manipulation current through this sensor; obtaining one or measurement values from at least one sensor; and evaluating a state of the measuring instrument, a state of one or more of its sensors, and/or a state of a coupling to an object of interest, from the one or more measurement values.

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Mainz, Germany

Joerg Gebhardt