Microvision, Inc.

Joel Sandgathe

Bruce Rothaar

Alga Lloyd Nothern, Iii

Dale Eugene Zimmerman

James Dean

Christopher Cannon

The embodiments described herein provide systems and methods that can facilitate increased detector sensitivity and reliability in a scanning laser device. Specifically, the systems and methods utilize detectors with multiple sensors that are configured to receive reflections of laser light pulses from objects within a scan field. These multiple sensors are configured to receive these reflections through the same optical assembly used to scan the laser light pulses out to the scan field. Furthermore, the multiple sensors are configured to at least partially cancel the effects of back reflections from within the optical assembly itself. The cancellation of the effects of back reflections from within the optical assembly can improve the sensitivity of the detector, particularly for the detection of low energy reflections of laser pulses from within the scan field.

Scanning laser devices and methods with detectors for sensing low energy reflections

A scanning beam projection system includes a scanning mirror having a fast-scan axis and a slow-scan axis. Movement on the fast-scan axis is controlled by a fast-scan scanning mirror control system. The control system receives position information describing angular displacement of the mirror. A fast-scan drive signal is generated that causes the scanning mirror to oscillate at a resonant frequency with a varying amplitude.

Scanning projector with non-rectangular display

A projection apparatus includes at least one laser diode and a laser diode junction temperature estimator to estimate the junction temperature of the at least one laser diode. Laser diode current drive values are modified in response to the estimated laser junction temperature. The modification of laser diode current drive values may occur as frequently as once per pixel.

Growing community of inventors

Portland, OR, United States of America

Joel Sandgathe