Texas Instruments Corporation

Joe Douglas Woodall

Charles K Harris

Sreenivasan Kalyani Koduri

Lance Cole Wright

Rajiv Roy

Thomas J Doty

Dennis Lee Doane

An illumination system for wire bonding at wire bonding locations which includes an illuminator having a highly light transmissive portion with an end surface and an axial bore extending therethrough and terminating at the end surface. The illuminator includes a first light source for directing light substantially axially through the bore to the end surface and a second light source for directing light substantially axially through the highly light transmissive portion to the end surface. The end surface is preferably a light diffusing surface. The bore is preferably tapered with the taper widening in a direction toward the end surface. The surface of the bore is preferably a light diffusing surface. The bore can alternately include a layer of highly light reflecting material disposed on its surface. The highly light transmissive portion has an outer surface which can include a layer of highly light reflecting material disposed thereon. The system further includes a mirror spaced from the bore in a direction opposed to the end surface and coaxial with the bore for reflecting light passing through the bore and circuitry to digitally store a representation of the reflected light.

Efficient hybrid illuminator

A device (10) identifies a defective object (12) from an image of the object (12) stored as pixel data in a pixel-data memory (52, 54, 56, 58). An inspection-point memory (72, 74, 76, 78) stores inspection-point data for the object (12). The inspection-point data represents inspection points (122, 124, . . . ) that are arranged in circuital (112, 136) and transverse (110) groups, where member inspection points of the circuital groups (112, 136) are also members of different ones of the transverse groups (110). A program memory (84) stores a program, which is executed by a processor (64, 66, 68, 70). The processor (64, 66, 68, 70) identifies which of the pixel data correspond to the inspection-point data, calculates differences between values of the corresponding pixel data within the circuital groups (112, 136), identifies a deviant pixel (116) if one of the differences exceeds a first threshold, calculates gradients of values of the corresponding pixel data within the transverse group (110a) including the deviant pixel and within at least one other transverse group (110b, 110c), and determines whether the gradients of the transverse group (110a) differs by more than a second threshold from the gradient of the other transverse group (10b, 10c).

Apparatus and method for identifying defective objects

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Euless, TX, United States of America

Joe Douglas Woodall