Robert Boschgmbh

Jochen Straehle

Pawel Drabarek

Juergen Hackenberg

Peter Rehbein

Stefan Franz

Michael Lindner

Matthias Fleischer

Juergen Bauer

Jan Fischer

David Rychtarik

Ulrich Lessing

Alexander Redlich

Georg Ketteler

Ralf Kochendoerfer

Martin Berger

Steffen Rath

Katrin Buechner

Martin Zimmer

Claus Westphal

Ruediger Bohnsack

Marcus Rinke

Gunther Bohn

Volker Kroeber

Method () for the quality control of a component (), wherein the component () is heated () by an energy source (), the intensity of which is periodically modulated () at at least one frequency &#x3c9;, and wherein the amplitude A and/or the phase &#x3c6; of a heat wave () which is modulated at the same frequency &#x3c9; and is emitted by the component () is/are recorded (), wherein the particle sized of the material, from which the component () is constructed, and/or the adhesion properties F of a functional layer () applied to the component () are evaluated () from the amplitude A and/or from the phase &#x3c6;. Apparatus () for carrying out the method.

Apparatus and method for the photothermal quality control of grain size and layer adhesion of a component

A method for determining the surface topography of a coated object and for the simultaneous spatially resolved determination of the thickness of the layer on the coated object. It is provided that the surface topography is measured with the aid of white-light interferometry, the thickness of the layer is measured by the principle of reflectometry, and by using, for both measurements, a shared radiation source having an electromagnetic radiation spectrum, which is reflected from the layer surface in a first wavelength range contained in the radiation spectrum and which penetrates into the layer in a second wavelength range contained in the radiation spectrum. Also described is a corresponding optical measuring instrument. The method and the optical measuring instrument make simultaneous highly accurate surface measurement of the surface topography and of the layer thickness of coated objects possible.

Optical measuring instrument using both reflectometry and white-light interferometry

A device for coupling beam guides of optical systems for unidirectional or bidirectional transmission of beams via a beam transition between the optical systems is provided, the device having a connecting device and mechanical centering means. The connecting device provides a magnetic coupling for implementing a coupling connection in a coupling area. The centering means are situated opposite one another on the optical systems and coupled in such a way to cause the beam guides to self-center due to the attraction caused by the magnetic forces.

Coupling device for a light guide

A fuel supply system, having a housing, in which a pistonlike element is disposed longitudinally displaceably in a bore and is guided sealingly in the bore by a guide portion. On one end, the guide portion adjoins a first fuel-filled chamber, and on its other end it adjoins a second fuel-filled chamber. At least one recess extending at least approximately in the circumferential direction is embodied in the guide portion of the pistonlike element and extends over at least part of the circumference of the pistonlike element and, viewed in the longitudinal direction of the pistonlike element, has an asymmetrical cross section.

Fuel supply for internal combustion engines

An interferometric measuring device for measuring the surface of an object by depth scanning, having a short-coherent light source, the emitted light of which is guided to a beam splitter for producing an object beam which is directed via an object beam path to the object and a reference beam which is directed via a reference beam path to a reference surface, having an image recorder for recording the light reflected by the object surface and by the reference surface and combined for interference, and having an evaluation device for determining the surface shape. A white light interferometer without mechanical actuating mechanisms for depth scanning is obtained by placing at least one active optical element that may be influenced by an electrical and/or magnetic field in the object beam path and/or the reference beam path, it being possible to use it to change the optical length of the object light path in relation to the optical length of the reference light path for the depth scanning.

Interferometric measuring device utilizing an active optical element

An interferometric measuring device includes a reference arm having a reference surface and a measuring arm having lighting optics for deflecting measuring light onto a measuring surface of an object to be measured, and having an image recorder connected to an analyzing device. A rapid, simple measurement with a rugged design of the measuring device may be achieved by configuring the lighting optics as a light guide body insertable into a cavity in the object to be measured, having a peripheral, radially symmetrical effective reflex surface directed radially or obliquely outward, and also including at least one deflector surface deflecting the measuring light onto same.

Interferometric measuring device

A method is for three-dimensionally, optically measuring measuring objects by comparison with a reference object, where image data of the measuring object are acquired and compared to image data of the reference object, and the measuring object is directly or indirectly assessed with regard to deviations from the reference object. A quick and, at the same time, reliable assessment of the measuring object is achieved in that the measuring object and/or the reference object or a holographic recording of the measuring object and/or of the reference object are/is rotated relative to one another about at least one axis, the image data of the measuring object being acquired and the comparison being performed in various, relative rotational positions, in that an evaluation regarding a maximum agreement of the measuring object with the reference object is performed in the different comparisons, and in that the deviation is assessed in the rotational position determined by the maximum agreement.

Method for three-dimensionally, optically measuring measuring objects

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Dettenhausen, Germany

Jochen Straehle