Infineon Technologies Ag

Jochen Müller

Gunnar H Krause

Justus Kuhn

Michael Schittenhelm

Wolfgang Ernst

Peter Pöchmüller

Jens Lüpke

Martin Randler

Harald Gundlach

Michael Hübner

Bernhard Trier

Volker Frey

Peter Pochmüller

Jürgen Weidenhöfer

A smart card contains a carrier body for receiving at least one system component, which has (in each case) a plurality of electrical components, and which unites the electrical functions for the operation of the smart card. The system component terminates approximately evenly with the top side of the card body of the smart card. At least one of the electrical components is accessible from the top side of the smart card.

Smart card containing a carrier body for receiving at least one system component having a plurality of electrical components and uniting electrical functions for operating the smart card

A portable data storage configuration has a card base and a display device, the display device being fixed to the card base. The display device is only partially connected to the card base by the fixed connection. This mounting technique results in that almost no lateral or shear forces act on the display device.

Data storage configuration having a display device

The method and the device generate digital signal patterns. Signal patterns or signal pattern groups are stored in a very small buffer register. The position of a following signal pattern or following signal pattern group is also stored in the form of a branch address, together with each signal pattern or each signal pattern group. A simple control logic circuit receives a control signal and determines whether the content of the currently addressed group is output continuously or the following group given by the branch address stored in the register is output after the currently selected group has been completely output. The novel method and device can advantageously be used for testing semiconductor memories and implemented in a cost-effective semiconductor circuit which is remote from a conventional test system.

Method and device for generating digital signal patterns

A system and a method for testing fast synchronous digital circuit with an additional built outside self test semiconductor chip disposed between a test device and circuit under test. The chip has a switching/detection unit that tests the chip based on external criteria between a first normal operating mode in which the chip tests the circuit to be tested, and a second operating mode in which programmable registers of the register unit of a receiver of the chip are programmed by the external test device. The registers store constants and variables for generating the test signals and for evaluating them. The chip generates test signals and transceiver for sending the test signals and receiving response signals generated thereby.

System for testing fast synchronous digital circuits, particularly semiconductor memory chips

A method and a configuration for driving one-time operable isolation elements on a semiconductor chip store an item of isolation information for each isolation element to be operated on the chip. In which case, as soon as the isolation information item is present for an isolation element, a one-time operation on the isolation element is begun.

Method of driving one-time operable isolation elements and circuit for driving the isolation elements

A method and a device for reading and for checking the time position of a data response read out from a memory module to be tested, in particular a DRAM memory operating in DDR operation. In a test receiver, the data response from the memory module to be tested is latched into a data latch with a data strobe response signal that has been delayed. A symmetrical clock signal is generated as a calibration signal. The calibration signal is used to calibrate the time position of the delayed data strobe response signal with respect to the data response. The delayed data strobe response signal is used for latching the data response. The delay time is programmed into a delay device during the calibration operation and also supplies a measure for testing precise time relationships between the data strobe response signal (DQS) and the data response.

Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

The novel address counter can be used in combination with an existing test unit&#x2014;serving for testing digital circuits&#x2014;for addressing synchronous high-frequency digital circuits, in particular fast memory devices. Address offset values are provided in programmable offset registers, with a multiplexer circuit and a selection and combination circuit, on the basis of input signals which are fed in at low frequency and in parallel by the test unit. Simple address changes and address jumps can be realized at a high clock frequency in a very flexible manner.

Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

A test configuration for testing a plurality of integrated circuits, in particular fast semiconductor memory modules located on a wafer, in parallel. The test configuration includes a carrier board for bringing up electrical signal lines belonging to a test system, contact-making needles for producing electrical connections with contact areas on the circuits to be tested, and a plurality of active modules that are arranged on the carrier board. The active modules are each assigned to one of the circuits to be tested in parallel, and are each case inserted into the signal path between the test system and the associated circuit to be tested. In a preferred embodiment, the active modules are arranged at least partly overlapping, based on a direction at right angles to the plane of the carrier board.

Method and probe card configuration for testing a plurality of integrated circuits in parallel

A circuit configuration for generating control signals for testing high-frequency synchronous digital circuits, especially memory chips, is described. A p-stage shift register which is clocked at a clock frequency corresponding to the high clock frequency of the digital circuit to be tested has connected to its parallel loading inputs p logical gates which logically combine a static control word with a dynamic n-position test word. The combined logical value is loaded into the shift register at a low-frequency loading clock rate so that a control signal, the value of which depends on the information loaded into the shift register in each clock cycle of the clock frequency of the latter is generated at the serial output of the shift register.

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Munich, Germany

Jochen Müller