U.S. Philips Corporation

Joachim Reich

Henning Schwarz

For measuring the frequency bandwidth of a signal-processing circuit with minimal external influences, a measuring circuit for a signal-processing circuit (1), arranged on an integrated circuit, for processing at least a picture signal is characterized in that measuring pulses are applied to the signal-processing circuit (1), in that the measuring circuit changes the charge of a capacitance (10) arranged in the measuring circuit, dependent on the time shift experienced by the measuring pulses in the signal-processing circuit (1), in that the measuring circuit switches the measuring capacitance (10) before each measuring process to a reference potential for a short time by means of an electronic switch (8), and in that the measuring circuit is arranged on the same integrated circuit as the signal-processing circuit (1) and is activated only during a measuring process.

Measuring circuit

A circuit for level adaptation between an I.sup.2 L circuit and a preceding combinatory logic circuit. The input current for the I.sup.2 L circuit is supplied by a direct current source which is connected to several switches which are controlled by the level on the output of the combinatory logic circuit, at least one of the outputs thereof being connected to an input of the I.sup.2 L circuit via a current mirror.

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Ahrensburg, Germany

Joachim Reich