Agilent Technologies, Inc.

Joachim Peerlings

Josef Beller

The present invention relates to an apparatus and to a method of measurement of optical loss of a DUT having a first end and a second end, comprising the steps of: coupling an optical signal into the first end of the DUT, measuring the optical power of the optical signal by a first detector, reflecting the optical signal at the second end of the DUT to send back a reflected optical signal into the DUT, measuring a reflected optical power of the reflected optical signal by a second detector, evaluating a two-way optical loss on the basis of measurements of the first and the second detectors.

Bidirectional optical loss measurement

An optical measuring device for providing a measurement of an optical device under test -DUT- comprises a measuring unit for providing an optical stimulus signal for the DUT and/or receiving a response signal of the DUT, and a visual fault localization unit for visually localizing faults within the DUT or a connection thereto. The measuring unit and the visual fault localization unit are preferably coupled to a signal direction unit, and the signal direction unit is further coupled to a connector representing an interface of the optical measuring device for coupling the DUT thereto.

Visual fault detection for optical measurements

The present invention relates to a method and to an apparatus for measuring an optical property, such as group delay or chromatic dispersion, of a DUT, comprising: a first coupler connected to the DUT for coupling a first optical signal having a first wavelength and a second optical signal having a second wavelength into the DUT, the second wavelength being variable with respect to the first wavelength, a detector connected to the DUT for detecting the first and the second signal leaving the DUT, an evaluation unit connected to the detector, for determining a difference in runtime, if any, between the first and the second signal having traveled at least one time through the DUT and for deriving the optical property from the detected difference.

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Ehningen, Germany

Joachim Peerlings