Bruker Axs Gmbh

Joachim Lange

Detlef Bahr

Rolf Schipper

Lutz Brügemann

Kai Uwe Mettendorf

Rolf-Dieter Schipper

Assunta Vigliante

Ekkehard Gerndt

Kurt Erlacher

Claus Bolzinger

A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analysis with multiple characteristic energy lines are possible without any need for conversion or switchover.

Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source

An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a common main center of rotation HDP and also one respective auxiliary center of rotation HD, HD. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance. The movement of the main center of rotation relative to the guidance can be easily driven by means of one single motor.

X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position

A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source () from which corresponding radiation is guided as a primary beam () to a sample () under investigation, with an X-ray or neutron detector () for receiving radiation diffracted or scattered from the sample (), wherein the source (), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop () is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.

Method for operating a primary beam stop

An X-ray optical system with two X-ray mirrors (A,B) for imaging an X-ray source (S) on a target region is characterized in that the X-ray mirrors (A,B) are mutually tilted by an angle other than 90&#xb0; such that the combined region of acceptance of the X-ray mirror (A,B) is adjusted to the shape of the X-ray source (S) and/or the target region. This increases the intensity of the focused X-ray radiation on the sample for a given emission of the X-ray source (S) power using a few, technically simple modifications.

X-ray optical system and method for imaging a source

An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qof the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (O) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qbetween first collimator (bl) and X-ray source (Q) is:/tan &#x3b1;,wherein &#x3b1;is the angle subtended by the first graded multi-layer mirror (A) in the x direction, as viewed from the first collimator (bl). This permits reduction of the disturbing radiation on the sample for constant useful X-radiation power from the source Q.

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Hagenbach, Germany

Joachim Lange