International Business Machines Corporation

Joachim Kneisel

Tilman Gloekler

Johannes Koesters

Christian Habermann

Naoki Kiryu

Jason Raymond Baumgartner

Otto Andreas Torreiter

The invention relates to a method and system for testing bit failures in array elements of an electronic circuit. Said method comprising the steps of changing an original hardware representation (DD) of the array such that errors can be injected in a memory by manipulation of associated read and/or write logic of the memory via input signals, building an emulator model (SME) from said changed hardware representation for emulating the array, and injecting errors into the changed hardware representation for determining the array to get stick capabilities.

Method and system for testing bit failures in array elements of an electronic circuit

The present invention provides an apparatus and a computer program product for applying external clock and data patterns for TTP-LBIST. A simulation model for the logic under test is set up in a simulator. Next, a user sets up an external LBIST block, which comprises pre-verified internal clock and data pattern logic, and connects this block to the logic in the simulation model. The internal clock and data pattern logic provides the input patterns used in OPCG modes of LBIST. This internal clock and data pattern logic is already verified through the design effort. Therefore, the internal pattern generators become the external pattern generators in the simulation model. The external LBIST block applies the external clock and data patterns, and subsequently, the user receives and processes these output patterns to determine if the logic operates correctly.

Apparatus for accelerating through-the-pins LBIST simulation

The present invention provides a method, an apparatus, and a computer program product for applying external clock and data patterns for TTP-LBIST. A simulation model for the logic under test is set up in a simulator. Next, a user sets up an external LBIST block, which comprises pre-verified internal clock and data pattern logic, and connects this block to the logic in the simulation model. The internal clock and data pattern logic provides the input patterns used in OPCG modes of LBIST. This internal clock and data pattern logic is already verified through the design effort. Therefore, the internal pattern generators become the external pattern generators in the simulation model. The external LBIST block applies the external clock and data patterns, and subsequently, the user receives and processes these output patterns to determine if the logic operates correctly.

Method and apparatus for accelerating through-the pins LBIST simulation

A method, system and computer program product for performing verification is disclosed. A high-level description of a design is created and constrained drivers are synthesized from the high-level description of the design. A testbench is generated from the high-level description of the design and the constrained drivers and a formal equivalence is evaluated on the testbench to perform verification.

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Berlin, Germany

Joachim Kneisel