Samsung Display Co., Ltd.

Jiyong Jung

Jinho Kim

Namhyoung Kim

Donghoon Lee

Eonpil Shin

Taejun Kim

Moonkyoung Yong

Myoungchul Kim

A substrate inspection apparatus includes: an image sensor which obtains first image data of a first substrate and second image data of a second substrate; and a processor which obtains synthetic image data by using the first and second image data, where the processor obtains first first spot information and first non-spot information of a first first spot area and a first non-spot area on the first substrate, based on the first image data, obtain first second spot information and second non-spot information of a first second spot area and a second non-spot area on locations on the second substrate corresponding to locations of the first first spot area and the first non-spot area on the first substrate, based on the second image data, and obtain the synthetic image data by using the first first spot information, the first second spot information and the first and second non-spot information.

Substrate inspecting apparatus for obtaining synthetic image data and method of inspecting substrate by obtaining synthetic image data

A display apparatus may include a substrate including a display area and a peripheral area, pixel circuits in the display area, data lines in the display area and connected to the pixel circuits, first circuit driving signal lines in the peripheral area, and configured to transmit a first circuit driving signal to drive the pixel circuits, a data test pad portion at the peripheral area, and including data test pads connected to the data lines, a pad portion on the peripheral area, and including first circuit pads connected to the first circuit driving signal lines, a first test pad portion at the peripheral area, and including first circuit test pads connected to the first circuit pads, and a second test pad portion at the peripheral area, and including second circuit test pads connected to the first circuit test pads.

Display apparatus

Growing community of inventors

Yongin-si, South Korea

Jiyong Jung