Alphion Corporation

Jiten Sarathy

Bharat P Dave

Boris Stefanov

Tan Buu Thai

Ronald Simprini

Kwang S Kim

Doruk Engin

Julio Martinez

Olga Nedzhvetskaya

Roman Antosik

David Lidsky

Michael Evans

Mohammad Laham

Frank N Hujber

Chinnabbu Ekambaram

Raj Acharya

Jayantha Das

Khem Gandhi

David Lowe

Frederick Renner

Ravi Vora

The present invention provides an optical signal quality selection system for optimizing the quality of information transmission. The system splits an incoming optical signal into two equal signals. The split signals are evaluated in optical performance monitors, transmitting an electrical output message to a signal selector relating to the quality of the respective signal. A second electrical message is sent from the optical performance generator to an alarm indicator signal generator, which sends an optical signal to the signal selector to drop the one of the split signals and transmit the non-dropped split signal. An unequipped optical signal from an optical idle signal generator is triggered if no active optical signal is being transmitted.

Optical signal quality selection system

A method of efficiently testing optical chips while still on the wafer is presented. One or more gutters for each chip on the wafer is provided, and either (1) a test signal is applied to the gutter to generate a response from the chip; or (2) a test signal is applied to the chip to generate a response from the gutter, where the gutter is in optical communication with the chip, and can reflect light incident or outgoing light at substantially a ninety degree angle.

Method and apparatus for testing an individual lightwave chip on a wafer

A method and circuit are presented for an all-optical format independent preprocessor that processes an arbitrary optical input signal by converting a NRZ signal to a PRZ signal, or if the input optical signal is RZ, by merely amplifying it. The method involves subtracting a delayed copy of the signal from the original, thereby effectively doubling its frequency, and inserting a pulse at each transition of the original signal, whether rising or falling. In a preferred embodiment this stage is implemented via an integrated SOA in each arm of an asymmetric interferometric device. The asymmetry consists of a delay element in one arm. In a preferred embodiment the entire device is fabricated on a semiconductor substrate, allowing for compactness as well as minimization of interconnectivity losses and overall power consumption. The output of the preprocessor, having a significant frequency component at its original clock rate, can then be fed to a clock recovery stage for all-optical clock recovery.

Format insensitive and bit rate independent optical preprocessor

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Atlantic Highlands, NJ, United States of America

Jiten Sarathy