Samsung Electronics Co., Ltd.

Jiseok Kang

Insu Choi

Wonjae Shin

Minsoo Kim

Donghoon Lee

Minsu Kim

Ho-Young Reho Lee

Chanik Park

Dae-Jeong Kim

Sung-Joon Kim

Tae-Kyeong Ko

Yongjun Yu

Jihyuk Oh

Junho Jung

Wooseop Kim

Yeonhwa Lee

Byungjik Kim

Youjin Jang

A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.

Memory module storing test pattern information, computer system comprising the same, and test method thereof

A memory system includes a nonvolatile memory module and a first controller configured to control the nonvolatile memory module. The nonvolatile memory module includes a volatile memory device, a nonvolatile memory device, and a second controller configured to control the volatile memory device and the nonvolatile memory device. The first controller may be configured to transmit a read request to the second controller. When, during a read operation according to the read request, normal data is not received from the nonvolatile memory device, the first controller may perform one or more retransmits of the read request to the second controller without a limitation on a number of times that the first controller performs the one or more retransmits of the read request.

Memory system including memory module, memory module, and operating method of memory module

A semiconductor memory module may include a random access memory, a nonvolatile memory, a buffer memory, and a controller configured to execute a reading operation on the buffer memory in response to an activation of a control signal. The controller may be further configured to execute a flush operation of storing first data, which are stored in the random access memory, in the nonvolatile memory, according to a result of the reading operation.

Semiconductor memory module and memory system including the same

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Hwaseong-si, South Korea

Jiseok Kang