Contemporary Amperex Technology Co., Ltd.

Contemporary Amperex Technology (hong Kong) Limited

Contemporary Amperex Technology Limited

Jirong Huo

Yanhui Fu

Le Chu

Qiandeng Li

Kai Wu

Yuqun Zeng

Changjian Liu

Jianwei Zhuo

Embodiments of this application relate to the field of electricity, and disclose a drive circuit. In some embodiments of this application, the drive circuit includes a low-side driver module and a delay module, the delay module is configured to output a delay signal of preset duration to the low-side driver module in a case that a control module is being reset; and the low-side driver module is configured to: according to on the delay signal of preset duration, maintain a first state within the preset duration, the first state being the same as a second state; where the second state is a working state of the low-side driver module before the control module is reset, and the second state includes being on or off. The embodiments can help avoid safety hazards caused by unexpected disconnection of a drive signal of the control module.

Drive circuit

Embodiments of this application relate to the field of electricity, and disclose a drive circuit. In some embodiments of this application, the drive circuit includes a high-side driver module and a delay module, the delay module is configured to output a delay signal of preset duration to the high-side driver module in a case that a control module is being reset; and the high-side driver module is configured to: according to the delay signal of preset duration, remain in a first state within the preset duration, the first state being the same as a second state; where the second state is a working state of the high-side driver module before the control module is reset, and the second state includes being on or off.

Disclosed are a load state detection circuit and method. A microcontroller is connected to a switch unit which is connected between a detecting power supply and a load to be tested. A voltage sampling point is formed at either terminal of the load to be tested, and the voltage sampling circuit is connected between the voltage sampling point and the microcontroller. The voltage sampling circuit is configured to sample a voltage at the voltage sampling point. The microcontroller is configured to connect the load to be tested and the detecting power supply by controlling the switch unit, and determine whether a fault exists in the load to be tested according to a received voltage at the voltage sampling point sampled by the voltage sampling circuit, before connecting the load to be tested with the drive power supply.

Load state detection circuit and method

The present disclosure discloses a detection circuit and method. The detection circuit comprises: a controller, a battery pack, a main positive switch module, a main negative switch module and at least one detection loop. The controller collects voltages of a positive electrode and a negative electrode of the battery pack and a voltage between external sides of the main positive switch module and the main negative switch module when turning on the main positive or negative switch module and after turning on any detection loop, and obtains resistance values of insulation resistors of the external sides according to resistance values of insulation resistors of internal sides of the main positive and negative switch module, as well as the voltages of the positive electrode and the negative electrode and the voltage between the external sides of the main positive switch module and the main negative switch module, which are collected twice.

Detection circuit and method

The present application provides a high voltage detection circuit and method. The high voltage detection circuit includes a current adjustment module configured to be turned on or off to adjust a current in a high voltage circuit, a first detection module configured to provide a detection signal and transmit the detection signal to a processor module and the processor module configured to determine whether a master positive switch or a master negative switch is in malfunction according to a desired operation state of the master positive switch, a desired operation state of the master negative switch and the detection signal.

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Ningde, China

Jirong Huo