Nippon Steel Corporation

Towa Corporation

Jiro Ohno

Hirokatsu Yashiro

Ryoichi Suzuki

Tamio Saito

Hisashi Kobayashi

Hisashi Gondo

Naoharu Ohikata

Katsuhiko Yui

Seizaburo Abe

Takehisa Mizunuma

Hiroshi Nishikawa

Yoshiteru Matsuo

Hirotoshi Kawamura

Toshio Yamamoto

Michio Osada

Tohru Iuchi

Kunitoshi Watanabe

Ryutaro Matsumoto

Yasuo Tokita

Hisanori Karasima

Seiichhiro Murashima

Toshiro Matsubara

A liquid crystal display apparatus comprising a liquid crystal display panel, plate-like light introducing means disposed behind the liquid crystal display panel, at least one light source receiving portion formed in the intermediate portion of the light introducing means, a light source disposed in the light source receiving portion, light diffusing means disposed between the light source and the liquid crystal display panel in front of at least the light source receiving portion, and light reflecting means disposed behind the light source.

Transmissive liquid display apparatus having a thin construction without

An apparatus for inspecting the top and bottom surfaces of a tape or sheet has a device to magnify the surface of the tape or sheet, with its objective lens disposed to face the top surface of the tape or sheet. The apparatus also has an optical transmittion system that transmits an image of the bottom surface of the tape or sheet through a focusing unit and four reflectors, each of which is adapted to bend the path of light rays 90 degrees. Of the four reflectors, one that faces the objective lens is retractable from the light-ray path in the optical transmission system. The reflector facing the objective lens may be a half-coated mirror. Fixed in the light-ray path in the optical transmission system, the half-coated mirror is not retractable.

Apparatus for inspecting both sides of tape or sheet

An IC chip is packaged on a film carrier. The film carrier comprises an insulation film and many conductive leads formed on the insulation film in predetermined patterns. Each of the leads has an inner lead portion to be connected to a terminal of the IC chip, and an outer lead portion to be connected to a conductive pattern of a mounting board. The film carrier further comprises an embankment, which is made of insulation material and formed on and/or in the vicinity of the outer lead portions of the leads to prevent an ooze of resin when the IC chip is sealed with the resin.

Film carrier for mounting IC chips

For measuring the sizes of particles in the falling state, electromagnetic waves having different frequencies are transmitted from a transmitter/receiver onto the particles in the falling state and reflected electromagnetic waves having different frequencies reflected from the particles in the falling state are received by the transmitter/receiver. Data of the distribution of sizes of the particles and the average size of the particles are derived from the detected intensities of the received reflected electromagnetic waves.

Measurement of sizes of falling particles

For measuring the sizes of particles in the falling state, electromagnetic waves having different frequencies are transmitted from a transmitter/receiver onto the particles in the falling state and reflected electromagnetic waves having different frequencies reflected from the particles in the falling state and received by the transmitter/receiver. Data of the distribution of sizes of the particles and the average size of the particles are derived from the detected intensities of the received reflected electromagnetic waves.

A method and apparatus for supervising a descending speed, thickness of a layer, particle size, and so on of charges in a blast furnace. Coke and ore composing the charges are detected by radiating an electromagnetic wave into the blast furnace. An electromagnetic wave can easily pass through coke, but is reflected or scattered by ore.

Method and apparatus for supervising charges in blast furnace using

A method of imaging the surface of an object at high temperature includes the steps of: irradiating the surface of a high-temperature object with two different kinds of pulses of monochromatic light of a fundamental wave and a harmonic thereof; passing the reflected light from the surface of the object through both an interference filter which allows only the two different kinds of monochromatic light to pass and a high-speed optical switch thereby to remove any background light component; drawing out only the reflected light of the pulses and leading the same to an image generating mechanism where it is converted into an image; and controlling the voltage applied to the high-speed optical switch thereby to adjust the mixing ratio between two wavelengths. Also disclosed is an apparatus for imaging the surface of an object at high temperature which includes: a light pulse generator provided such as to be opposed to high-temperature object; and an interference filter, a half-mirror, a high-speed optical switch and an image generating mechanism which are successively disposed on the optical axis of the reflected light from the object.

Method of and apparatus for imaging surface of object at high temperature

A method for measuring the water level in a well including the steps of radiating an electromagnetic wave to a gap between a boring drill rod and a casing pipe by using a transmitting antenna, receiving the electromagnetic wave reflected by a surface of the water level in the casing pipe by using a receiving antenna; then measuring a distance between the surface of the water level and the receiving antenna based on the going and returning time of the electromagnetic wave.

Method and apparatus for measuring water level in a well

In order to obtain a film having a low electric resistance and a good selective absorption property of solar radiation, good rust proofing and good weldability, a stainless steel is dipped in a chemical conversion bath, in which sodium bichromate or potassium bichromate is mixed with sulfuric acid at a predetermined proportion to one another, in accordance with the method of the present invention. The product film of the present invention comprises metal oxides or metal hydroxides with metal (Fe+Cr) finely dispersed therein.

Metal sheet that selectively absorbs solar radiation

Hydrogen storage metal material consisting of Ti-Fe-Mm which contains Mm in an atomic ratio in the range of from 0.015 to 0.1 with respect to Fe and optionally containing S in an atomic ratio in the range of from 0.004 to 0.04.

Hydrogen storage metal material

Method for producing a selective absorption sheet of a solar radiation

A hydrogen absorbing and desorbing metal material which comprises elements belonging to the IIa-Va groups having the ability to form metal hydrides, and S at an atomic ratio of 0.004-0.04 in terms of one of the elements.

A method and an apparatus for measuring a heated material in an industrial furnace by the use of a radiation thermometer comprising providing a sliding means at the tip portion of the radiation thermometer, changing a distance between the heated material and the shielding means to determine background radiation rate of the energy reflected or emitted from the atmosphere of the furnace. The background radiation rate is determined by the output energy of the radiation thermometer, which together with an accurate temperature of the heated material and an ambient temperature of the furnace, are used to calculate a temperature error at arbitrary distances. Setting the shielding means of the radiation thermometer in a position at which the temperature error is within a tolerable range, and measuring the heated material with use of the radiation thermometer.

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Kawasaki, Japan

Jiro Ohno