Honda Motor Co., Ltd.

Jiro Fukui

Tomoyo Matsumoto

Kosuke Kasagi

Takuya Nomura

An in-vehicle control apparatus includes: a first inverter; a second inverter; and a voltage conversion part configured to increase or decrease an operation voltage of one of the first inverter and the second inverter by an open-close control of a switch and supply the increased or decreased operation voltage as an operation voltage of another of the first inverter and the second inverter. The voltage conversion part includes: a reference voltage line; a low-voltage-side switch that is connected to and between the reference voltage line and a high-voltage-side power line of the second inverter; and a high-voltage-side switch that is connected to and between a high-voltage-side power line of the first inverter and a high-voltage-side power line of the second inverter. The in-vehicle control apparatus includes: a detection part that detects a short circuit failure of the low-voltage-side switch; and a control part that performs a phase short circuit control that short-circuits at least one of a plurality of low-voltage-side switches and a plurality of high-voltage-side switches of the second inverter upon detection of a short circuit failure of the low-voltage-side switch by the detection part.

In-vehicle control apparatus and program

A power converter which can prevent an erroneous detection even when a flow rate of a refrigerant is low and a vehicle having the power converter mounted therein are provided. A first inverter circuit including: an element group constituted by six transistors; six diode temperature sensors at least one of which is provided for each transistor to detect a temperature of the transistor; and a high arm-side refrigerant flow passage and a low arm-side refrigerant flow passage in which a refrigerant for cooling the transistors flows is provided. In a failure detection device of the first inverter circuit, a failure determination member selects two diode temperature sensors among the plurality of diode temperature sensors, which detect temperatures of two adjacent transistors, as an adjacent sensor pair, and determines a failure of any one of the plurality of diode temperature sensors using detection values of the adjacent sensor pair.

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Wako, Japan

Jiro Fukui